18533528. INSPECTION DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
INSPECTION DEVICE
Organization Name
Inventor(s)
KENJI Suzuki of Yokohama-shi (JP)
Mitsunori Numata of Yokohama-shi (JP)
Shinji Ueyama of Yokohama-shi (JP)
Tomoki Onishi of Yokohama-shi (JP)
INSPECTION DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18533528 titled 'INSPECTION DEVICE
The abstract describes an inspection device that enhances the accuracy of a Magnetic Random Access Memory (MRAM) element by utilizing a combination of magnetic fields and optical systems.
- The inspection device consists of a stage where the MRAM element is placed and electromagnets that generate magnetic fields.
- The magnetic field can be changed in direction based on the position of the MRAM element on the stage.
- An optical system illuminates the MRAM element with polarized light and detects reflected light when the position of the MRAM element is altered.
- The device uses a combination of magnetic fields and light to accurately inspect the MRAM element.
Potential Applications: - Quality control in MRAM manufacturing processes - Research and development of MRAM technology - Testing and validation of MRAM elements in electronic devices
Problems Solved: - Improving the accuracy and reliability of MRAM elements - Ensuring consistent performance of MRAM technology - Enhancing the efficiency of MRAM inspection processes
Benefits: - Increased accuracy in MRAM element inspection - Improved quality control in MRAM production - Enhanced performance and reliability of MRAM technology
Commercial Applications: Title: Advanced MRAM Inspection Device for Enhanced Quality Control This technology can be utilized in semiconductor manufacturing companies, electronics manufacturers, and research institutions working on MRAM technology. It can improve the quality control processes and ensure the reliability of MRAM elements in various electronic devices.
Questions about MRAM Inspection Device: 1. How does the combination of magnetic fields and optical systems improve the accuracy of MRAM inspection?
The magnetic fields help manipulate the MRAM element's properties, while the optical system detects changes in reflected light, resulting in a more precise inspection process.
2. What are the potential implications of using this inspection device in the semiconductor industry?
This device can lead to higher quality MRAM production, reduced defects, and improved overall performance of electronic devices utilizing MRAM technology.
Original Abstract Submitted
An inspection device improves accuracy characteristics of an (MRAM), the inspection device including a stage on which a MRAM element is fixed, and electromagnets generating a first magnetic field. A magnetic field having a component in a direction perpendicular to the stage is changeable from a first direction to a second direction according to a position on the stage. A second magnetic field in which a direction of a magnetic field component is parallel to the stage changes from a third direction to a fourth direction according to the position on the stage, an optical system illuminating the MRAM element with light including polarized light, and condensing reflected light from reflected illumination light from the MRAM element, and a detector detecting reflected light when the position of the MRAM element is changed, and when the position of the MRAM element in the second magnetic field is changed.
