18532896. FUNCTIONAL TESTING METHOD (INVENTEC CORPORATION)
FUNCTIONAL TESTING METHOD
Organization Name
Inventor(s)
Chih-Jen Chin of Taipei City (TW)
Cheng-Hung Wu of Taipei City (TW)
Yi-Ping Yang of Taipei City (TW)
FUNCTIONAL TESTING METHOD
This abstract first appeared for US patent application 18532896 titled 'FUNCTIONAL TESTING METHOD
Original Abstract Submitted
A functional testing method, adapted to a device under test, includes, by a main control chip, performing: requesting a test script according to identification information of the device under test from a database server, wherein the test script comprises a plurality of testing items of different types, and testing the device under test according to the test script.