18530609. SCAN DRIVING CIRCUIT AND DISPLAY DEVICE HAVING THE SAME simplified abstract (Samsung Display Co., LTD.)
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SCAN DRIVING CIRCUIT AND DISPLAY DEVICE HAVING THE SAME
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SCAN DRIVING CIRCUIT AND DISPLAY DEVICE HAVING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 18530609 titled 'SCAN DRIVING CIRCUIT AND DISPLAY DEVICE HAVING THE SAME
The abstract describes a scan driving circuit with multiple stages, each stage consisting of a buffer part, a holding part, and an inverter part. The inverter part controls the potentials of the first and second control nodes using a control transistor with a dummy gate.
- The scan driving circuit includes multiple stages with specific functions for each stage.
- Each stage has a buffer part, a holding part, and an inverter part.
- The inverter part controls the potentials of the first and second control nodes using a control transistor with a dummy gate.
- The control transistor is connected to the first control node and can receive different low voltages at the drain terminal.
Potential Applications: - Integrated circuits - Semiconductor devices - Memory devices
Problems Solved: - Efficient control of potentials in scan driving circuits - Improved performance of integrated circuits
Benefits: - Enhanced functionality of semiconductor devices - Increased efficiency in memory devices - Improved overall performance of integrated circuits
Commercial Applications: Title: Advanced Scan Driving Circuit for Semiconductor Devices This technology can be utilized in the development of advanced semiconductor devices, improving their performance and efficiency. The market implications include increased demand for high-performance integrated circuits in various industries.
Prior Art: Readers can explore prior research on scan driving circuits, control transistors, and semiconductor device technologies to gain a deeper understanding of the field.
Frequently Updated Research: Stay updated on the latest advancements in scan driving circuits, semiconductor devices, and integrated circuit technologies to remain at the forefront of innovation.
Questions about Scan Driving Circuits: 1. How does the inverter part control the potentials of the first and second control nodes? The inverter part uses a control transistor with a dummy gate connected to the first control node to regulate the potentials effectively.
2. What are the potential applications of scan driving circuits in the semiconductor industry? Scan driving circuits can be applied in integrated circuits, semiconductor devices, and memory devices to enhance their performance and efficiency.
Original Abstract Submitted
A scan driving circuit includes multiple stages. A j-th stage of the stages includes a buffer part electrically connected to an output terminal that operates in response to a potential of a first control node, a holding part electrically connected to the output terminal that operates in response to a potential of a second control node, and an inverter part electrically connected to the first and second control nodes that controls the potentials of the first and second nodes. The inverter part includes a control transistor including a gate electrically connected to the first control node, and a drain electrically connected to a first voltage terminal that receives a first low voltage or a second voltage terminal that receives a second low voltage. The control transistor includes a dummy gate that receives a low voltage lower than or equal to the first and second low voltages.
