18529057. SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD simplified abstract (Tokyo Electron Limited)

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SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

Organization Name

Tokyo Electron Limited

Inventor(s)

Gentaro Goshi of Koshi City (JP)

SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18529057 titled 'SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

The patent application describes a substrate processing apparatus that includes a liquid processing device to supply a processing liquid onto a substrate and form a liquid film on its surface.

  • The apparatus includes a buffer tank to store the processing liquid, a supply pipe to connect the liquid source, buffer tank, and nozzle, and a supply controller to regulate the supply of the processing liquid.
  • It also features a dissolved oxygen concentration measuring device to monitor the oxygen levels in the liquid and a controller to determine whether to supply the liquid based on the measurement results.

Potential Applications: - Semiconductor manufacturing - Thin film deposition processes - Solar cell production

Problems Solved: - Ensures precise control of processing liquid supply - Maintains optimal dissolved oxygen levels for processing

Benefits: - Improved substrate processing quality - Enhanced process efficiency - Reduced material waste

Commercial Applications: - Advanced manufacturing industries - Research and development facilities - Semiconductor fabrication plants

Prior Art: Prior art related to this technology may include patents or research papers on substrate processing equipment with liquid supply control systems and dissolved oxygen monitoring devices.

Frequently Updated Research: Researchers may be exploring ways to optimize dissolved oxygen levels in processing liquids for various applications, including substrate processing.

Questions about the Technology: 1. How does the apparatus ensure precise control of the processing liquid supply? 2. What are the potential benefits of maintaining optimal dissolved oxygen levels in substrate processing?


Original Abstract Submitted

A substrate processing apparatus includes a liquid processing device configured to supply a processing liquid onto a substrate from a nozzle and form a liquid film of the processing liquid on a surface of the substrate; a processing liquid supply comprising: a buffer tank configured to store therein the processing liquid supplied from a processing liquid source; a supply pipe configured to connect the processing liquid source, the buffer tank and the nozzle; and a supply controller configured to perform a supply and a stop of the supply of the processing liquid to the nozzle; a dissolved oxygen concentration measuring device configured to measure a dissolved oxygen concentration in the processing liquid; and a controller configured to determine whether or not to supply the processing liquid to the substrate based on a measurement result, and configured to control the supply controller based on a determination result.