18528375. TRIM SETTING DETERMINATION ON A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
Contents
TRIM SETTING DETERMINATION ON A MEMORY DEVICE
Organization Name
Inventor(s)
Aswin Thiruvengadam of Folsom CA (US)
Daniel L. Lowrance of El Dorado Hills CA (US)
TRIM SETTING DETERMINATION ON A MEMORY DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18528375 titled 'TRIM SETTING DETERMINATION ON A MEMORY DEVICE
The present disclosure pertains to determining trim settings on a memory device based on the operational characteristics of the memory cells.
- The apparatus can determine a set of trim settings for the memory cell array.
- The trim settings are associated with desired operational characteristics for the memory cells.
Potential Applications:
- Memory devices in electronic devices
- Data storage systems
- Semiconductor manufacturing
Problems Solved:
- Optimizing memory cell performance
- Enhancing data storage efficiency
Benefits:
- Improved memory device reliability
- Enhanced data retention capabilities
Commercial Applications:
- Memory chip manufacturers
- Data center storage solutions providers
Questions about Memory Device Trim Settings: 1. How do trim settings impact memory cell performance?
- Trim settings can optimize memory cell operation for better efficiency and reliability.
2. What are the key factors considered when determining trim settings for memory devices?
- Operational characteristics and desired performance metrics play a crucial role in setting trim parameters.
Original Abstract Submitted
The present disclosure includes apparatuses and methods related to determining trim settings on a memory device. An example apparatus can determine a set of trim settings for the array of memory cells based on the operational characteristics of the array of memory cells, wherein the set of trim settings are associated with desired operational characteristics for the array of memory cells.
