18524008. ELECTRONIC DEVICE AND ELECTRONIC SYSTEM WITH CRITICAL CONDITION DETECTION AND CONTROL CAPABILITY FOR POWER ELECTRONIC DEVICES simplified abstract (Infineon Technologies AG)
Contents
- 1 ELECTRONIC DEVICE AND ELECTRONIC SYSTEM WITH CRITICAL CONDITION DETECTION AND CONTROL CAPABILITY FOR POWER ELECTRONIC DEVICES
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 ELECTRONIC DEVICE AND ELECTRONIC SYSTEM WITH CRITICAL CONDITION DETECTION AND CONTROL CAPABILITY FOR POWER ELECTRONIC DEVICES - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 How does this technology impact energy consumption in electronic systems?
- 1.11 What are the potential cost implications of implementing this technology in electronic systems?
- 1.12 Original Abstract Submitted
ELECTRONIC DEVICE AND ELECTRONIC SYSTEM WITH CRITICAL CONDITION DETECTION AND CONTROL CAPABILITY FOR POWER ELECTRONIC DEVICES
Organization Name
Inventor(s)
Jens De Bock of Wadersloh (DE)
Andreas Lenniger of Anroechte (DE)
Bjoern Rentemeister of Soest (DE)
Stefan Hubert Schmies of Arnsberg (DE)
ELECTRONIC DEVICE AND ELECTRONIC SYSTEM WITH CRITICAL CONDITION DETECTION AND CONTROL CAPABILITY FOR POWER ELECTRONIC DEVICES - A simplified explanation of the abstract
This abstract first appeared for US patent application 18524008 titled 'ELECTRONIC DEVICE AND ELECTRONIC SYSTEM WITH CRITICAL CONDITION DETECTION AND CONTROL CAPABILITY FOR POWER ELECTRONIC DEVICES
Simplified Explanation
The abstract describes an electronic device that can monitor and control power semiconductor devices based on telemetry information. The device can adjust gate voltage levels for these devices based on current slew rates and temperatures exceeding predetermined levels.
- The electronic device includes an interface for receiving telemetry information for power semiconductor devices.
- A data acquisition and processing unit adjusts gate voltage levels based on current slew rates and temperatures exceeding predetermined levels.
Potential Applications
This technology could be applied in various industries such as power electronics, automotive, renewable energy, and industrial automation.
Problems Solved
1. Overheating of power semiconductor devices. 2. Ensuring safe operation of power semiconductor devices with high current slew rates.
Benefits
1. Improved efficiency and reliability of power semiconductor devices. 2. Enhanced safety measures for electronic systems.
Potential Commercial Applications
Optimizing power management systems in electric vehicles for better performance and longevity.
Possible Prior Art
Prior art may include similar systems used in industrial automation or power distribution systems.
Unanswered Questions
How does this technology impact energy consumption in electronic systems?
This technology can potentially optimize energy consumption by ensuring power semiconductor devices operate within safe parameters, reducing wastage and improving efficiency.
What are the potential cost implications of implementing this technology in electronic systems?
The cost implications could vary depending on the scale of implementation and the specific requirements of the electronic system. However, the long-term benefits of improved efficiency and reliability may outweigh the initial costs of implementation.
Original Abstract Submitted
An electronic device includes an interface configured to receive telemetry information for one or more power semiconductor devices and a data acquisition and processing unit. The data acquisition and processing unit may be configured to increase a gate voltage above a maximum permitted level for each of the one or more power semiconductor devices having a current slew rate that exceeds a predetermined level as determined by the telemetry information. The data acquisition and processing unit may be configured to increase a gate voltage above a maximum permitted level for each of the one or more power semiconductor devices having a temperature that exceeds a predetermined level as determined by the telemetry information. An electronic system that includes the electronic device is also described.
