18522872. SYSTEM AND METHOD FOR ANALYZING SYSTEM HEALTH OF INDIVIDUAL ELECTRONIC COMPONENTS USING COMPONENT RELATIONAL GRAPHS simplified abstract (Bank of America Corporation)

SYSTEM AND METHOD FOR ANALYZING SYSTEM HEALTH OF INDIVIDUAL ELECTRONIC COMPONENTS USING COMPONENT RELATIONAL GRAPHS

Organization Name

Bank of America Corporation

Inventor(s)

Maharaj Mukherjee of Poughkeepsie NY (US)

Carl M. Benda of Kannapolis NC (US)

Elvis Nyamwange of Little Elm TX (US)

Utkarsh Raj of Charlotte NC (US)

Suman Roy Choudhury of Berkeley Heights NJ (US)

Vidya Srikanth of Sunnyvale CA (US)

Colin Murphy of Charlotte NC (US)

SYSTEM AND METHOD FOR ANALYZING SYSTEM HEALTH OF INDIVIDUAL ELECTRONIC COMPONENTS USING COMPONENT RELATIONAL GRAPHS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18522872 titled 'SYSTEM AND METHOD FOR ANALYZING SYSTEM HEALTH OF INDIVIDUAL ELECTRONIC COMPONENTS USING COMPONENT RELATIONAL GRAPHS

Simplified Explanation

The patent application describes a method for analyzing the system health of individual electronic components using component relational graphs. The method involves receiving a process request, determining the components used in the process, generating a component knowledge graph, and determining a health rating for each component.

• The method involves receiving a process request.
• Determining the components used in the process.
• Generating a component knowledge graph.
• Determining a health rating for each component.

Potential Applications

This technology can be applied in various industries such as electronics manufacturing, telecommunications, and data centers to monitor and analyze the health of individual electronic components.

Problems Solved

This technology helps in identifying and addressing potential issues with electronic components before they lead to system failures, thereby improving overall system reliability and performance.

Benefits

The benefits of this technology include improved system reliability, reduced downtime, increased efficiency in maintenance and troubleshooting, and enhanced overall performance of electronic systems.

Potential Commercial Applications

Potential commercial applications of this technology include offering system health analysis services to electronic component manufacturers, system integrators, and IT departments to ensure the optimal performance of their systems.

Possible Prior Art

One possible prior art for this technology could be traditional system health monitoring methods that rely on manual inspection and testing of individual components, which may not be as efficient or accurate as the automated approach described in this patent application.

How does this technology handle real-time monitoring of component health?

The article does not specify how the method handles real-time monitoring of component health. This could be crucial for industries where immediate action is required in case of component failures.

What are the scalability limitations of this technology?

The scalability limitations of this technology are not addressed in the article. Understanding the maximum number of components that can be efficiently analyzed using this method would be important for large-scale applications.

Original Abstract Submitted

Systems, computer program products, and methods are described herein for analyzing system health of individual electronic components using component relational graphs. The method includes receiving a process request. The process request is a request to execute a process. The method also includes determining one or more components of the system used during the process. The method further includes generating a component knowledge graph for the process. The component knowledge graph includes one or more nodes corresponding to each of one or more components used during the process. The method still further includes determining a component health rating for each of the one or more components used in the process.