18520262. INSPECTION SYSTEM AND INSPECTION METHOD simplified abstract (Kabushiki Kaisha Toshiba)

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INSPECTION SYSTEM AND INSPECTION METHOD

Organization Name

Kabushiki Kaisha Toshiba

Inventor(s)

Ryota Sekiya of Kamakura Kanagawa (JP)

INSPECTION SYSTEM AND INSPECTION METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18520262 titled 'INSPECTION SYSTEM AND INSPECTION METHOD

Simplified Explanation

The patent application describes an inspection system that uses machine learning models to determine if a target contains a specific object.

Key Features and Innovation

  • Utilizes two measurement units to measure the target.
  • Employs machine learning models for making determinations.
  • Updates the machine learning model based on the second determination.

Potential Applications

This technology can be used in quality control processes in manufacturing, security screenings, and medical diagnostics.

Problems Solved

  • Enhances accuracy in identifying specific objects within a target.
  • Streamlines inspection processes by automating determinations.
  • Improves overall efficiency and reliability of inspections.

Benefits

  • Reduces human error in object identification.
  • Increases speed of inspections.
  • Enhances overall quality control measures.

Commercial Applications

  • This technology can be applied in industries such as manufacturing, security, and healthcare for automated inspection processes, leading to improved product quality and safety.

Questions about Inspection System

How does the inspection system improve accuracy in identifying objects within a target?

The inspection system utilizes machine learning models to analyze measurement results and make determinations, leading to more precise identification of specific objects.

What are the potential applications of this technology beyond manufacturing and security screenings?

This technology can also be used in medical diagnostics to identify specific objects within a patient's body, improving the accuracy and efficiency of medical examinations.


Original Abstract Submitted

According to one embodiment, an inspection system includes a first measurement unit for measuring a target, a first determination unit for making a first determination on whether the target includes a predetermined object using a first machine learning model based on a measurement result by the first measurement unit, a second measurement unit for measuring the target, a second determination unit for making a second determination on whether the target includes the predetermined object based on a measurement result by the second measurement unit, and a processing unit for generating first update data of the first machine learning model based on the second determination.