18517699. INTERFEROMETER WITH ABSORBING LAYER simplified abstract (Murata Manufacturing Co., Ltd.)
Contents
- 1 INTERFEROMETER WITH ABSORBING LAYER
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 INTERFEROMETER WITH ABSORBING LAYER - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
INTERFEROMETER WITH ABSORBING LAYER
Organization Name
Murata Manufacturing Co., Ltd.
Inventor(s)
Ville Kaajakari of Helsinki (FI)
INTERFEROMETER WITH ABSORBING LAYER - A simplified explanation of the abstract
This abstract first appeared for US patent application 18517699 titled 'INTERFEROMETER WITH ABSORBING LAYER
Simplified Explanation
The abstract describes a micromechanical Fabry-Perot interferometer with a transparent substrate, reflectors, an absorbing reflector layer, temperature determination arrangement, and actuators to adjust the gap between reflectors.
- Transparent substrate: The device includes a substrate that allows light to pass through.
- Reflectors: There is a reflector on the top surface of the substrate and an absorbing reflector layer above it.
- Absorbing reflector layer: This layer absorbs certain wavelengths of infrared light.
- Temperature determination arrangement: There is a mechanism to determine the temperature of the absorbing reflector layer.
- Actuators: At least one actuator is present to adjust the gap between the reflector and the absorbing reflector layer.
Potential Applications
This technology could be used in:
- Optical sensors
- Spectroscopy
- Interferometry
Problems Solved
- Precise temperature measurement
- Control of light interference patterns
Benefits
- High sensitivity
- Miniaturization
- Improved accuracy in temperature measurement
Potential Commercial Applications
- Optical Sensing Technology in Healthcare
Possible Prior Art
No prior art known.
Unanswered Questions
How does the temperature determination arrangement work in practice?
The specific method used to determine the temperature of the absorbing reflector layer is not detailed in the abstract.
What materials are used in the construction of the device?
The abstract does not specify the materials used for the substrate, reflectors, or absorbing reflector layer.
Original Abstract Submitted
A micromechanical Fabry-Perot interferometer is provided that includes an at least partly transparent substrate; an illuminated area where the light is passed through the substrate; a reflector on the top surface of the substrate in the illuminated area; an absorbing reflector layer above the reflector in the illuminated area, which absorbs at least some wavelengths of the infrared light; an arrangement for determining the temperature of the absorbing reflector layer; and at least one actuator to adjust the gap between the reflector and the absorbing reflector layer.
