18514628. EXTERNAL CONNECTION TERMINAL simplified abstract (FUJIFILM Corporation)
Contents
- 1 EXTERNAL CONNECTION TERMINAL
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 EXTERNAL CONNECTION TERMINAL - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Commercial Applications
- 1.9 Prior Art
- 1.10 Frequently Updated Research
- 1.11 Questions about Spark Failure Prevention Technology
- 1.12 Original Abstract Submitted
EXTERNAL CONNECTION TERMINAL
Organization Name
Inventor(s)
Katsuyuki Nukui of Kanagawa (JP)
Kazuhiro Hasegawa of Kanagawa (JP)
EXTERNAL CONNECTION TERMINAL - A simplified explanation of the abstract
This abstract first appeared for US patent application 18514628 titled 'EXTERNAL CONNECTION TERMINAL
Simplified Explanation
The patent application describes an external connection terminal that prevents spark failure. It consists of a conductive portion connected to an electronic circuit and an insulated non-conductive portion. The design of the terminal ensures a specific ratio of non-conductive to conductive areas and heights to prevent spark failure.
- The external connection terminal prevents spark failure by incorporating a specific design ratio of non-conductive to conductive areas and heights.
- It consists of a conductive portion connected to an electronic circuit and an insulated non-conductive portion.
- The design of the terminal ensures that the ratio of non-conductive to conductive areas and heights meets specific criteria to suppress spark failure.
Potential Applications
The technology can be applied in various electronic devices and systems where spark failure prevention is crucial, such as automotive electronics, industrial equipment, and consumer electronics.
Problems Solved
The technology addresses the issue of spark failure in external connection terminals, which can lead to malfunctions or damage in electronic circuits. By preventing spark failure, it ensures the reliability and longevity of electronic devices.
Benefits
- Improved reliability of electronic circuits - Prevention of malfunctions and damage due to spark failure - Extended lifespan of electronic devices
Commercial Applications
Title: Spark Failure Prevention Technology for Enhanced Electronic Reliability The technology can be utilized in automotive electronics, industrial machinery, consumer electronics, and other electronic systems where spark failure prevention is essential. It can enhance the reliability and durability of electronic devices, leading to increased customer satisfaction and reduced maintenance costs for manufacturers.
Prior Art
Readers interested in prior art related to spark failure prevention in external connection terminals can explore patents and research papers in the field of electronic components and circuit protection.
Frequently Updated Research
Researchers are continually exploring new materials and designs to improve spark failure prevention in external connection terminals. Stay updated on the latest advancements in electronic circuit protection to enhance the reliability of electronic devices.
Questions about Spark Failure Prevention Technology
How does the design of the external connection terminal prevent spark failure?
The design incorporates specific ratios of non-conductive to conductive areas and heights to suppress spark failure effectively.
What are the potential applications of this technology beyond electronic devices?
This technology can also be applied in industrial equipment, automotive systems, and various other electronic systems where spark failure prevention is critical.
Original Abstract Submitted
An external connection terminal capable of suppressing spark failure. The external connection terminal includes: a conduction portion that is electrically connected to an electronic circuit; and a non-conduction portion that is electrically insulated from the electronic circuit, in which the conduction portion and the non-conduction portion consist of a material including metal, and a ratio x of an occupied area of the non-conduction portion to an occupied area of the conduction portion in a plan view and a ratio y of a height of the non-conduction portion to a height of the conduction portion simultaneously satisfy x≥0.30, y≥1.00, and y≥−0.50×x+1.25.
