18514233. PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE MEDIUM simplified abstract (NEC Corporation)
Contents
- 1 PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE MEDIUM
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE MEDIUM - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 How does this technology handle variations in work environments or conditions?
- 1.11 What are the limitations of this technology in terms of scalability and integration with existing systems?
- 1.12 Original Abstract Submitted
PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE MEDIUM
Organization Name
Inventor(s)
PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18514233 titled 'PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE MEDIUM
Simplified Explanation
The present invention provides a processing apparatus for detecting abnormal work with high accuracy through image analysis.
- First computation unit computes the first degree of abnormality of a work at each image photographing time based on the processing result of a plurality of images acquired by photographing a first work being performed for a predetermined time.
- Second computation unit computes the second degree of abnormality of the first work based on the first degrees of abnormality computed in association with each of the plurality of images.
Potential Applications
This technology can be applied in industries where monitoring and detecting abnormal work processes are crucial, such as manufacturing, construction, and healthcare.
Problems Solved
1. Improved accuracy in detecting abnormal work processes through image analysis. 2. Real-time monitoring of work activities to prevent potential hazards or errors.
Benefits
1. Enhanced safety in workplaces. 2. Increased efficiency in identifying and addressing abnormal work processes. 3. Reduction in potential risks and accidents.
Potential Commercial Applications
"Enhanced Abnormal Work Detection Technology in Manufacturing"
Possible Prior Art
There may be prior art related to image analysis for detecting abnormalities in work processes, but specific information is not provided in this context.
Unanswered Questions
How does this technology handle variations in work environments or conditions?
The technology may need to be adaptable to different settings and scenarios to ensure accurate detection of abnormal work processes.
What are the limitations of this technology in terms of scalability and integration with existing systems?
It is essential to understand how easily this technology can be scaled up for larger operations and how well it can integrate with current monitoring systems in various industries.
Original Abstract Submitted
In order to detect an abnormal work with high accuracy by image analysis, the present invention provides a processing apparatus including a first computation unit that computes a first degree of abnormality being a degree of abnormality of a work at each image photographing time, based on a processing result of each of a plurality of images acquired by photographing a state of a first work being performed for a predetermined time; and a second computation unit that computes a second degree of abnormality being a degree of abnormality of the first work, based on a plurality of the first degrees of abnormality computed in association with each of the plurality of images.
