18500629. APPARATUS AND METHOD WITH IMAGE GENERATION simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
APPARATUS AND METHOD WITH IMAGE GENERATION
Organization Name
Inventor(s)
Prashant Pandurang Shinde of Bengaluru (IN)
Shashishekara Parampalli Adiga of Bengaluru (IN)
Priyadarshini Panemangalore Pai of Bengaluru (IN)
APPARATUS AND METHOD WITH IMAGE GENERATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 18500629 titled 'APPARATUS AND METHOD WITH IMAGE GENERATION
The abstract of this patent application describes a processor-implemented method for generating images with defect information based on input parameters and defect profiles.
- Receiving a plurality of input parameters for images to be generated
- Generating defect profiles with size and location of defects to be formed in the images
- Generating images with defect information using image rendering operation
Potential Applications: - Quality control in manufacturing processes - Medical imaging for identifying anomalies - Security systems for detecting irregularities in images
Problems Solved: - Efficiently generating images with specific defects - Enhancing accuracy in defect detection - Streamlining image rendering processes
Benefits: - Improved quality control measures - Enhanced anomaly detection capabilities - Time and cost savings in image generation
Commercial Applications: Title: "Advanced Image Generation Technology for Quality Control" This technology can be utilized in industries such as manufacturing, healthcare, and security for enhancing quality control processes and anomaly detection systems.
Prior Art: Researchers can explore existing patents related to image rendering, defect detection, and quality control systems to understand the background of this technology.
Frequently Updated Research: Stay updated on advancements in image rendering algorithms, defect detection techniques, and quality control methodologies to enhance the application of this technology.
Questions about Image Generation Technology: 1. How does this technology improve defect detection in images? 2. What industries can benefit the most from this advanced image generation method?
Original Abstract Submitted
A processor-implemented method with image generation includes: receiving a plurality of input parameters for a plurality of images to be generated; generating a plurality of defect profiles comprising a size and location of one or more defects to be formed in an image; and generating the plurality of images comprising defect information based on the plurality of defect profiles and the plurality of input parameters using an image rendering operation.
