18498658. SYSTEM AND METHOD FOR INSPECTING DISPLAY DEVICE HAVING INPUT SENSOR simplified abstract (Samsung Display Co., LTD.)
Contents
SYSTEM AND METHOD FOR INSPECTING DISPLAY DEVICE HAVING INPUT SENSOR
Organization Name
Inventor(s)
SEUNGROK Lee of YONGIN-SI (KR)
SYSTEM AND METHOD FOR INSPECTING DISPLAY DEVICE HAVING INPUT SENSOR - A simplified explanation of the abstract
This abstract first appeared for US patent application 18498658 titled 'SYSTEM AND METHOD FOR INSPECTING DISPLAY DEVICE HAVING INPUT SENSOR
The abstract describes an inspection system that includes a display device product with a display panel and an input sensor, as well as an inspection device with an inspection signal generator, memory, and noise detector.
- The inspection signal generator provides an inspection signal to the display panel indicative of a first image pattern.
- The memory stores a reference signal responsive to a second image pattern.
- The noise detector receives a sensing signal from the input sensor responsive to the first image pattern, detects a first noise based on the sensing signal, and detects a second noise based on the reference signal.
Potential Applications: - Quality control in manufacturing processes - Inspection of electronic components - Security screening in airports or public venues
Problems Solved: - Ensures accurate inspection of image patterns - Detects and eliminates noise interference in the inspection process
Benefits: - Improved accuracy and reliability in inspections - Enhanced security measures in various applications - Streamlined quality control processes
Commercial Applications: Title: Advanced Inspection System for Quality Control This technology can be used in industries such as manufacturing, electronics, and security for efficient and reliable inspection processes, leading to improved product quality and safety.
Questions about the technology: 1. How does the noise detector differentiate between different types of noise in the inspection process? 2. What are the specific parameters used to determine the reference signal stored in the memory?
Original Abstract Submitted
An inspection system includes a display device product comprising a display panel and an input sensor; and an inspection device comprising an inspection signal generator configured to provide to the display panel an inspection signal indicative of a first image pattern, a memory configured to store a reference signal responsive to a second image pattern, and a noise detector configured to receive from the input sensor a sensing signal responsive to the first image pattern, detect a first noise based on the sensing signal, and detect a second noise based on the reference signal.
