18496920. MULTI-CHIP PACKAGE HAVING STRESS RELIEF STRUCTURE simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
MULTI-CHIP PACKAGE HAVING STRESS RELIEF STRUCTURE
Organization Name
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Inventor(s)
JEN-YUAN Chang of Hsinchu (TW)
MULTI-CHIP PACKAGE HAVING STRESS RELIEF STRUCTURE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18496920 titled 'MULTI-CHIP PACKAGE HAVING STRESS RELIEF STRUCTURE
Simplified Explanation
The abstract describes a method of manufacturing a semiconductor package involving bonding multiple die groups of varying thicknesses to a substrate and encapsulating them with a carrier substrate containing air gaps.
- Provides a method for manufacturing a semiconductor package with multiple die groups of different thicknesses.
- Involves bonding the die groups to a substrate.
- Encapsulates the die groups with a carrier substrate containing air gaps.
- Ensures the carrier substrate has a thickness equal to or greater than the difference between the thicknesses of the die groups.
Potential Applications
- Semiconductor industry for manufacturing advanced semiconductor packages.
- Electronics industry for creating high-performance electronic devices.
Problems Solved
- Efficiently bonding die groups of varying thicknesses to a substrate.
- Providing a solution for encapsulating die groups with a carrier substrate containing air gaps.
Benefits
- Allows for the manufacturing of complex semiconductor packages.
- Enhances the performance and reliability of electronic devices.
- Provides a cost-effective solution for semiconductor packaging.
Original Abstract Submitted
A method of manufacturing a semiconductor package includes: providing a substrate; providing a first die group comprising a first set of one or more dies, wherein the first die group is characterized by a first thickness; bonding a lower surface of the first die group to the substrate; providing a second die group comprising a second set of one or more dies, wherein the second die group is characterized by a second thickness larger than the first thickness; bonding the second die group to the substrate; providing a carrier substrate encapsulating at least one air gap, wherein the carrier substrate is characterized by a third thickness equal to or greater than a difference between the second thickness and the first thickness; and bonding a lower surface of the carrier substrate to an upper surface of the first die group.