18481794. ILLUMINATION DEVICE OF REFLECTION TYPE FOURIER PTYCHOGRAPHIC MICROSCOPY AND CONTROL METHOD THEREOF simplified abstract (ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE)

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ILLUMINATION DEVICE OF REFLECTION TYPE FOURIER PTYCHOGRAPHIC MICROSCOPY AND CONTROL METHOD THEREOF

Organization Name

ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor(s)

Yongjun Lim of Daejeon (KR)

Kwan-Jung Oh of Daejeon (KR)

ILLUMINATION DEVICE OF REFLECTION TYPE FOURIER PTYCHOGRAPHIC MICROSCOPY AND CONTROL METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 18481794 titled 'ILLUMINATION DEVICE OF REFLECTION TYPE FOURIER PTYCHOGRAPHIC MICROSCOPY AND CONTROL METHOD THEREOF

Simplified Explanation

The abstract describes a reflection-type Fourier ptychographic microscopy (FPM) system, including an objective lens, a light splitter, two illumination systems with LED arrays, and a camera.

  • Objective lens, light splitter, LED arrays, and camera are key components of the reflection-type FPM system.
  • First illumination system with LED array irradiates a beam passing through the objective lens.
  • Second illumination system with LED array radiates a beam to a measurement sample in the periphery of the objective lens, moving in an up and down direction based on a virtual center line.
  • The system allows for high-resolution imaging of samples using computational reconstruction techniques.

Potential Applications

This technology can be applied in various fields such as biology, materials science, and nanotechnology for high-resolution imaging and analysis of samples.

Problems Solved

1. Enables high-resolution imaging of samples without the need for expensive and complex equipment. 2. Provides a cost-effective and efficient method for capturing detailed images of samples.

Benefits

1. Improved image resolution and quality. 2. Cost-effective solution for high-resolution microscopy. 3. Versatile system suitable for various applications in research and industry.

Potential Commercial Applications

Optimizing LED arrays for microscopy applications in industries such as pharmaceuticals, semiconductor manufacturing, and biotechnology.

Possible Prior Art

Prior art in the field of microscopy and imaging techniques, such as traditional microscopy methods and digital imaging technologies, may exist. However, the specific combination of components and methods described in this patent application may be novel.

Unanswered Questions

How does this technology compare to existing microscopy techniques in terms of resolution and cost-effectiveness?

The article does not provide a direct comparison with other microscopy techniques in terms of resolution and cost-effectiveness.

What are the limitations of the reflection-type FPM system described in the patent application?

The article does not mention any potential limitations or challenges associated with the implementation of the reflection-type FPM system.


Original Abstract Submitted

A reflection-type Fourier ptychographic microscopy (FPM), a control method of the reflection-type FPM, and a system thereof are disclosed. According to an embodiment of the present disclosure, a reflection FPM may include an objective lens; a light splitter connected to a member including the objective lens; a first illumination system including a first LED array composed of a plurality of LEDs for irradiating a first beam passing through the objective lens through the light splitter; a second illumination system including a plurality of LEDs for radiating a second beam to a measurement sample in a periphery of the objective lens, and repeatedly moving in an up and down direction based on a virtual center line penetrating the objective lens; and a camera.