18470456. MEASURING METHOD AND MEASURING DEVICE simplified abstract (Japan Display Inc.)
MEASURING METHOD AND MEASURING DEVICE
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Inventor(s)
MEASURING METHOD AND MEASURING DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18470456 titled 'MEASURING METHOD AND MEASURING DEVICE
Simplified Explanation
The measuring method described in the abstract involves analyzing images of a partition to measure the amount of protrusion of an upper portion from a lower portion.
- Formation of a partition with a lower portion on a base and an upper portion protruding from the lower portion.
- Acquisition of an image of the partition from a different surface using an optical microscope.
- Analysis of the acquired image to measure the amount of protrusion of the upper portion from the lower portion.
Potential Applications
This technology could be applied in industries such as manufacturing, quality control, and research where precise measurements of protrusions are required.
Problems Solved
This technology solves the problem of accurately measuring the amount of protrusion of one object from another, which can be challenging to do manually or with less precise methods.
Benefits
The benefits of this technology include increased accuracy in measurements, efficiency in data collection, and the ability to analyze and quantify protrusions in a non-destructive manner.
Potential Commercial Applications
A potential commercial application of this technology could be in the semiconductor industry for measuring the protrusions of micro-components with high precision.
Possible Prior Art
One possible prior art for this technology could be the use of laser scanning or 3D imaging techniques for measuring protrusions in various industries.
Unanswered Questions
How does this technology compare to traditional methods of measuring protrusions manually?
This technology offers a more accurate and efficient way of measuring protrusions compared to traditional manual methods, which can be time-consuming and prone to human error.
What are the limitations of using an optical microscope for measuring protrusions in this method?
One limitation of using an optical microscope for measuring protrusions is the potential for limited depth of field, which may affect the accuracy of measurements for objects with complex shapes or varying heights.
Original Abstract Submitted
According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a first surface side of a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image including the partition observed from a second surface side opposed to the first surface of the base by an optical microscope, analyzing the acquired first image, and measuring an amount of protrusion by which an end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.