18462105. DISPLAY DEVICE simplified abstract (SAMSUNG DISPLAY CO., LTD.)

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DISPLAY DEVICE

Organization Name

SAMSUNG DISPLAY CO., LTD.

Inventor(s)

Won Mi Hwang of Yongin-si (KR)

Ji Su Na of Yongin-si (KR)

Su Mi Jang of Yongin-si (KR)

DISPLAY DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18462105 titled 'DISPLAY DEVICE

Simplified Explanation

The patent application describes a display device with a unique circuit layout for testing the lighting state of light emitting elements.

Key Features and Innovation

  • Circuit layer with demux circuit units for testing light emitting elements
  • Test signal supply lines for transmitting test signals
  • Test pad connection lines for connecting to test signal pads
  • Test line connection contact holes for electrical connections
  • Test connection area for testing adjacent to the display area

Potential Applications

This technology can be used in various display devices such as smartphones, tablets, and TVs to ensure the proper functioning of light emitting elements.

Problems Solved

This technology addresses the need for efficient testing of light emitting elements in display devices without affecting the display quality.

Benefits

  • Improved testing capabilities for light emitting elements
  • Enhanced reliability and performance of display devices
  • Cost-effective solution for manufacturing processes

Commercial Applications

  • Display device manufacturing industry
  • Consumer electronics market
  • Technology and innovation sector

Prior Art

Readers can explore prior patents related to display device testing methods and circuit layouts to understand the evolution of this technology.

Frequently Updated Research

Stay updated on advancements in display device testing methods and circuit designs to incorporate the latest innovations into product development.

Questions about Display Device Testing

How does the unique circuit layout improve the testing process?

The unique circuit layout allows for efficient testing of light emitting elements without interfering with the display functionality.

What are the potential cost savings associated with this technology?

Implementing this technology can lead to cost savings in manufacturing processes by streamlining the testing of light emitting elements.


Original Abstract Submitted

A display device includes a substrate, a circuit layer, a light emitting element layer, and a display driving circuit. The circuit layer comprises demux circuit units side by side in a demux area of a non-display area of the substrate and electrically connected between data lines and the display driving circuit, test signal supply lines in the non-display area and transmitting test signals for testing the lighting state of light emitting elements of the light emitting element layer, and test pad connection lines respectively electrically connected to test signal pads in the sub-area and extending to the non-display area. The test signal supply lines are electrically connected to the test pad connection lines through test line connection contact holes, respectively. The test line connection contact holes are in a test connection area which is a part of the demux area adjacent to the sub-area.