18451006. INSPECTION SYSTEM AND CONTROL METHOD simplified abstract (CANON KABUSHIKI KAISHA)
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Contents
INSPECTION SYSTEM AND CONTROL METHOD
Organization Name
Inventor(s)
HIDESHI Ichimi of Ibaraki (JP)
INSPECTION SYSTEM AND CONTROL METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18451006 titled 'INSPECTION SYSTEM AND CONTROL METHOD
Simplified Explanation
- User interface allows setting an inspection region in a sheet with a different shape from the correct image sheet
- Inspection processing is performed on an image output to the sheet with a different shape based on the inspection region set in advanced settings
- The processing involves the correct image and an image obtained from a camera reading
Potential Applications
- Quality control in manufacturing processes
- Medical imaging for precise diagnostics
- Security systems for identifying anomalies
Problems Solved
- Ensures accurate inspection even on sheets with different shapes
- Improves efficiency in identifying defects or irregularities
- Allows for customization in setting inspection regions
Benefits
- Enhanced accuracy in inspection processes
- Increased flexibility in handling various sheet shapes
- Improved quality control measures
Original Abstract Submitted
An example of a user interface that enables setting an inspection region in a sheet having a different shape from a sheet set for a correct image will be described below. Inspection processing is performed on an image output to the sheet having the different shape from the sheet set for the correct image, based on the inspection region set in advanced settings, the correct image, and an image obtained as a result of reading by a camera.
