18443948. DIFFERENTIAL STROBE FAULT IDENTIFICATION simplified abstract (Micron Technology, Inc.)
Contents
- 1 DIFFERENTIAL STROBE FAULT IDENTIFICATION
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 DIFFERENTIAL STROBE FAULT IDENTIFICATION - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Differential Strobe Fault Indication Technology
- 1.13 Original Abstract Submitted
DIFFERENTIAL STROBE FAULT IDENTIFICATION
Organization Name
Inventor(s)
Scott E. Schaefer of Boise ID (US)
Paul A. Laberge of Shoreview MN (US)
DIFFERENTIAL STROBE FAULT IDENTIFICATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 18443948 titled 'DIFFERENTIAL STROBE FAULT IDENTIFICATION
Simplified Explanation
The patent application describes methods, systems, and devices for differential strobe fault indication in memory devices. Faults are indicated using a read strobe signal, such as a read data strobe (RDQS) signal, based on characteristics like signal patterns or voltage levels.
- Memory devices can indicate faults using a read strobe signal like RDQS_t or RDQS_c.
- Faults can be identified based on characteristics of the read strobe signal, such as signal patterns or voltage levels.
- Host devices can determine fault types (recoverable or unrecoverable) based on fault signatures in the read strobe signal.
Key Features and Innovation
- Differential strobe fault indication in memory devices.
- Fault identification based on read strobe signal characteristics.
- Host device recovery operations based on fault type.
Potential Applications
This technology can be applied in various memory devices and systems where fault indication and recovery are crucial, such as data centers, servers, and embedded systems.
Problems Solved
- Efficient fault indication in memory devices.
- Improved fault identification for timely recovery operations.
Benefits
- Enhanced reliability and fault tolerance in memory systems.
- Streamlined fault recovery processes for improved system performance.
Commercial Applications
Title: Differential Strobe Fault Indication Technology for Memory Devices This technology can be commercially utilized in the data storage industry, server maintenance services, and embedded system development. It offers a competitive advantage by ensuring quick fault detection and recovery, reducing downtime and enhancing overall system reliability.
Prior Art
Readers interested in exploring prior art related to this technology can start by researching fault indication methods in memory devices, read strobe signal analysis, and fault recovery mechanisms in storage systems.
Frequently Updated Research
Stay updated on the latest advancements in fault indication and recovery technologies in memory devices to leverage cutting-edge solutions for improved system reliability and performance.
Questions about Differential Strobe Fault Indication Technology
How does the differential strobe fault indication technology improve fault detection in memory devices?
The technology enhances fault detection by analyzing characteristics of the read strobe signal, allowing for quick identification and timely recovery operations.
What are the potential applications of the patent's fault indication method in memory devices?
The fault indication method can be applied in various memory systems, data centers, and servers to ensure reliable operation and efficient fault recovery processes.
Original Abstract Submitted
Methods, systems, and devices for differential strobe fault indication are described. A memory device may be configured to indicate a fault using a read strobe signal. The read strobe signal may be a read data strobe (RDQS) signal, such as a true RDQS (RDQS_t) signal or a complement RDQS (RDQS_c) signal. In some examples, the memory device may indicate the fault based on a characteristic of the read strobe signal, such as a pattern of the read strobe signal, a voltage level of the read strobe signal, a difference between a first read strobe signal and a second read strobe signal, or any combination thereof. In some examples, a host device may identify a fault type (e.g., recoverable or unrecoverable) based on a fault signature associated with a given characteristic of the read strobe signal. The host device may perform recovery operations based on the fault type identified.
