18441926. APPARATUS AND TEST ELEMENT GROUP simplified abstract (Micron Technology, Inc.)
Contents
APPARATUS AND TEST ELEMENT GROUP
Organization Name
Inventor(s)
FUMIE Uchida of Kyoto-shi (JP)
APPARATUS AND TEST ELEMENT GROUP - A simplified explanation of the abstract
This abstract first appeared for US patent application 18441926 titled 'APPARATUS AND TEST ELEMENT GROUP
The patent application describes an apparatus with active regions on a semiconductor substrate, connected by an active bridge region, and test circuit elements on the active bridge region and the active regions.
- The apparatus includes multiple active regions on a semiconductor substrate.
- An active bridge region connects two of the active regions.
- Test circuit elements are located on the active bridge region and the two active regions.
Potential Applications: - This technology could be used in the development of advanced semiconductor devices. - It may find applications in the field of integrated circuits and microelectronics.
Problems Solved: - Provides a solution for connecting active regions on a semiconductor substrate. - Enables testing of circuit elements in a more efficient manner.
Benefits: - Improved connectivity between active regions. - Enhanced testing capabilities for circuit elements. - Potential for increased efficiency in semiconductor device development.
Commercial Applications: Title: Advanced Semiconductor Device Development Technology This technology could be utilized by semiconductor companies to enhance their product development processes, leading to more efficient and reliable semiconductor devices. The market implications include potential cost savings and faster time-to-market for new products.
Questions about the Technology: 1. How does this technology improve the testing process for circuit elements? - This technology allows for test circuit elements to be located on the active bridge region and the active regions, enabling more efficient testing procedures. 2. What are the potential advantages of using an active bridge region to connect active regions on a semiconductor substrate? - The active bridge region provides a direct connection between two active regions, improving overall connectivity and functionality of the semiconductor device.
Original Abstract Submitted
According to one or more embodiments of the disclosure, an apparatus comprising a plurality of active regions on a semiconductor substrate, an active bridge region connecting two active regions among the plurality of active regions, and a plurality of test circuit elements on the active bridge region and the two active regions.
