18441462. INTEGRATED CIRCUITS WITH SELECTABLE PACKAGING TYPES simplified abstract (Micron Technology, Inc.)

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INTEGRATED CIRCUITS WITH SELECTABLE PACKAGING TYPES

Organization Name

Micron Technology, Inc.

Inventor(s)

Kishan Chanumolu of Bengaluru (IN)

Sandeep Dwivedi of Bengaluru (IN)

INTEGRATED CIRCUITS WITH SELECTABLE PACKAGING TYPES - A simplified explanation of the abstract

This abstract first appeared for US patent application 18441462 titled 'INTEGRATED CIRCUITS WITH SELECTABLE PACKAGING TYPES

The apparatus described in the patent application includes a die with three faces, I/O cells, wirebonded interconnections, flip-chip interconnections, and a bond area with decoupling capacitors.

  • The die has a first face, a second face opposite the first face, and a third face located between them.
  • I/O cells are coupled to the first face of the die and can be selectively bonded to a package using wirebonded interconnections at a first pitch or flip-chip interconnections at a larger second pitch.
  • A bond area, located between each I/O cell and the third face of the die, includes decoupling capacitors.

Potential Applications: - Semiconductor packaging - Integrated circuit design - Electronic device manufacturing

Problems Solved: - Efficient bonding of I/O cells to packages - Improved signal integrity and power distribution in electronic devices

Benefits: - Enhanced performance of electronic devices - Increased reliability of semiconductor packages - Simplified manufacturing processes

Commercial Applications: Title: Advanced Semiconductor Packaging Technology for Enhanced Performance This technology can be used in the production of high-performance electronic devices such as smartphones, computers, and automotive electronics. It can also benefit companies involved in semiconductor packaging and integrated circuit design.

Questions about the technology: 1. How does the use of decoupling capacitors in the bond area improve the performance of electronic devices? 2. What are the advantages of using flip-chip interconnections over wirebonded interconnections in semiconductor packaging?


Original Abstract Submitted

An apparatus includes a die with a first face, a second face opposite the first face, and a third face located between the first face and the second face, I/O cells coupled to the first face of a die, where the I/O cells are configured to be selectively bonded to a package by wirebonded interconnections at a first pitch or flip-chip interconnections at a second pitch that is larger than the first pitch, and a bond area including decoupling capacitors that is located between each I/O cell and the third face of the die.