18441421. OPTICAL MEASUREMENT DEVICE simplified abstract (Mitsubishi Electric Corporation)
Contents
OPTICAL MEASUREMENT DEVICE
Organization Name
Mitsubishi Electric Corporation
Inventor(s)
Takanori Yamauchi of Tokyo (JP)
Yoshiaki Konishi of Tokyo (JP)
OPTICAL MEASUREMENT DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18441421 titled 'OPTICAL MEASUREMENT DEVICE
Simplified Explanation: The patent application describes an optical measurement device that splits light into measurement and reference light, uses a switch interferometer to generate interference light, converts it into electric signals, and calculates optical path-length differences.
- Utilizes a splitter to divide light into measurement and reference components.
- Employs a switch interferometer to create interference light from orthogonally polarized waves of reference and reflected light.
- Converts interference light into electric signals using a photoelectric converter.
- Performs A/D conversion on the electric signals through a digital converter.
- Calculates optical path-length differences between polarized waves of reference and reflected light, and between reference and measurement light.
Potential Applications: 1. Optical metrology for precision measurements. 2. Interferometry for surface profiling and defect detection. 3. Biomedical imaging for tissue analysis. 4. Remote sensing for environmental monitoring.
Problems Solved: 1. Accurate measurement of optical path-length differences. 2. Enhanced interference signal processing. 3. Improved signal-to-noise ratio in optical measurements.
Benefits: 1. High precision in optical measurements. 2. Increased sensitivity in interference signal detection. 3. Enhanced data accuracy and reliability.
Commercial Applications: Optical Measurement Device for Precision Metrology and Interferometry: Market Implications
Prior Art: No prior art information available at this time.
Frequently Updated Research: No frequently updated research relevant to this technology at present.
Questions about Optical Measurement Device: Question 1: How does the switch interferometer improve interference light generation? Answer: The switch interferometer enables the interference of orthogonally polarized waves, enhancing the accuracy of optical path-length measurements.
Question 2: What are the key advantages of using a digital converter in the optical measurement device? Answer: The digital converter ensures precise A/D conversion of electric signals, leading to improved data processing and analysis.
Original Abstract Submitted
An optical measurement device includes: a splitter to split light into measurement light and reference light; a switch interferometer to output first interference light obtained by causing two orthogonally polarized waves of the reference light to interfere with each other, second interference light obtained by causing two orthogonally polarized waves of reflected light from a target object of the measurement light to interfere with each other, and third interference light obtained by causing the reference light and the reflected light to interfere with each other; a photoelectric converter to convert the interference light into electric signals; a digital converter to perform A/D conversion on the electric signals; and a calculation processor to obtain an optical path-length difference between the two orthogonally polarized waves of each of the reference light and the reflected light, and an optical path-length difference between the reference light and the measurement light.
