18432525. COMMUNICATION NODE TO INTERFACE BETWEEN EVALUATION SYSTEMS AND A MANUFACTURING SYSTEM simplified abstract (Applied Materials, Inc.)

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COMMUNICATION NODE TO INTERFACE BETWEEN EVALUATION SYSTEMS AND A MANUFACTURING SYSTEM

Organization Name

Applied Materials, Inc.

Inventor(s)

Michael Howells of San Jose CA (US)

Thorsten Kril of Santa Cruz CA (US)

Hemanth Konanur Nagendra of Santa Clara CA (US)

Jatinder Sasan of San Jose CA (US)

COMMUNICATION NODE TO INTERFACE BETWEEN EVALUATION SYSTEMS AND A MANUFACTURING SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18432525 titled 'COMMUNICATION NODE TO INTERFACE BETWEEN EVALUATION SYSTEMS AND A MANUFACTURING SYSTEM

Simplified Explanation

The abstract describes an electronic device manufacturing system with a process tool and a tool server that communicates with a monitoring device to collect data, send it to an evaluation system, receive feedback data, and trigger corrective actions by the process tool.

  • The system includes a process tool and a tool server.
  • The tool server has a communication node and an evaluation system.
  • The communication node receives data from a monitoring device on the process tool.
  • The received data is sent to the evaluation system.
  • Feedback data is received from the evaluation system.
  • The process tool performs corrective actions based on the feedback data.

Potential Applications

This technology could be applied in various manufacturing industries where precise monitoring and feedback mechanisms are crucial for maintaining quality and efficiency in production processes.

Problems Solved

1. Ensures real-time monitoring and feedback for process optimization. 2. Enables automated corrective actions to be taken promptly based on evaluation feedback.

Benefits

1. Improves production efficiency and quality control. 2. Reduces the need for manual intervention in the manufacturing process. 3. Enhances overall operational performance and reliability.

Potential Commercial Applications

Optimizing production processes in industries such as semiconductor manufacturing, automotive assembly, and electronics production.

Possible Prior Art

One possible prior art could be the use of similar monitoring and feedback systems in industrial automation and control processes.

What is the impact of this technology on manufacturing efficiency?

The technology described in the patent application significantly improves manufacturing efficiency by enabling real-time monitoring, data collection, and automated corrective actions. This ensures that production processes run smoothly and any deviations from the desired parameters are promptly addressed, leading to higher productivity and quality output.

How does this technology contribute to cost savings in manufacturing operations?

By automating the monitoring, evaluation, and corrective action processes, this technology reduces the need for manual intervention and minimizes the risk of errors or defects in production. This results in cost savings by optimizing resource utilization, reducing downtime, and improving overall operational efficiency.


Original Abstract Submitted

An electronic device manufacturing system that includes a process tool and a tool server coupled to the process tool and comprising a communication node and an evaluation system. The communication node is configured to receive, from a monitoring device registered on the process tool, data based on a data collection plan and send the received data to the evaluation system. The communication node is further configured to receive, from the evaluation system, feedback data based on the received data and cause the process tool to perform a corrective action based on the feedback data.