18429729. METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE simplified abstract (Texas Instruments Incorporated)

METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE

Organization Name

Texas Instruments Incorporated

Inventor(s)

Zachary John Brown of Sugar Land TX (US)

METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18429729 titled 'METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE

The patent application presents a device and method for determining the largest and smallest successful values of receive and transmit clock delays in a system involving an SPI and DDR flash memory.

• The first set of parameters for the SPI coupled to the DDR flash memory is established, including the largest successful values of transmit and receive clock delays, and a specific value for a read cycle.
• A second set of parameters for the SPI is set, including the smallest successful values of transmit and receive clock delays, and a different value for the read cycle.
• One of the two sets of parameters is selected based on the successful reading from the DDR flash memory over a wider range of operating temperatures.
• The SPI is then programmed using the selected set of parameters.

Key Features and Innovation:

• Determination of largest and smallest successful clock delay values.
• Setting parameters for SPI operation based on temperature range.
• Selection of optimal parameters for successful data reading.

Potential Applications:

• Data storage systems.
• Embedded systems.
• Industrial control systems.

Problems Solved:

• Ensuring successful data transfer in varying temperature conditions.
• Optimizing SPI performance for DDR flash memory.

Benefits:

• Improved reliability of data transfer.
• Enhanced performance in different operating environments.

Commercial Applications:

• Data storage solutions for industrial applications.
• Embedded systems in automotive electronics.
• IoT devices requiring reliable data transfer.

Prior Art: Prior research may include studies on clock delay optimization in SPI communication systems.

Frequently Updated Research: Stay updated on advancements in clock delay optimization for SPI devices in data storage systems.

Questions about Clock Delay Optimization in SPI Systems: 1. How does clock delay optimization impact data transfer reliability in SPI systems? 2. What are the key considerations when selecting clock delay values for SPI operation?

Original Abstract Submitted

A device and method are presented. Largest and smallest successful values of a receive clock delay and a transmit clock delay are determined. A first set of parameters for an SPI coupled to a DDR flash memory are set, including the largest successful values of the transmit clock delay and the receive clock delay, and a first value of a RD cycle. A second set of parameters for the SPI are set, including the smallest successful value of the transmit clock delay and receive clock delay, and a second value of the RD cycle. One of the first and second sets of parameters is selected based on whether the first or second set of parameters results in successfully reading from the DDR flash memory over a larger range of operating temperatures. The SPI is programmed using the selected one of the first and second sets of parameters.