18423389. INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM simplified abstract (CANON KABUSHIKI KAISHA)

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INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM

Organization Name

CANON KABUSHIKI KAISHA

Inventor(s)

Atsushi Nogami of Kawasaki-shi (JP)

Yusuke Mitarai of Tokyo (JP)

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18423389 titled 'INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM

Simplified Explanation

The abstract describes an information processing device that detects defects in an input image, extracts features from the defect area, and determines the attribute of the defect based on the extracted features.

  • Defect detecting unit: Detects defects in an input image.
  • Extracting unit: Extracts feature amounts from the defect area in the input image.
  • Attribute determining unit: Determines the attribute of the defect using the extracted features.

Potential Applications

This technology could be applied in various industries such as manufacturing, quality control, and medical imaging for defect detection and classification.

Problems Solved

This technology helps in automating the process of defect detection and classification, saving time and reducing human error in identifying and categorizing defects.

Benefits

- Improved accuracy in defect detection - Increased efficiency in quality control processes - Reduction in manual labor for defect classification

Potential Commercial Applications

"Defect Detection and Attribute Determination Technology for Quality Control in Manufacturing"

Possible Prior Art

One possible prior art could be traditional defect detection systems that rely on manual inspection or basic automated algorithms for defect identification.

Unanswered Questions

How does this technology handle complex defects with multiple attributes?

The abstract does not specify how the system deals with defects that have multiple attributes or characteristics. Further details on the algorithm's capability to handle such cases would be beneficial.

What is the computational cost of implementing this technology in real-time applications?

The abstract does not mention the computational resources required to run this defect detection system in real-time. Understanding the system's efficiency and speed in practical applications would be essential for potential users.


Original Abstract Submitted

There is provided with an information processing device. A defect detecting unit detects a defect of an object in an input image. An extracting unit extracts a feature amount pertaining to a partial image of the defect from the input image, on the basis of a result of detecting the defect. An attribute determining unit determines an attribute of the defect using the feature amount pertaining to the partial image of the defect.