18423059. READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM simplified abstract (Micron Technology, Inc.)

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READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM

Organization Name

Micron Technology, Inc.

Inventor(s)

Melissa I. Uribe of El Dorado Hills CA (US)

READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18423059 titled 'READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM

Simplified Explanation

The patent application describes methods, systems, and devices for read command fault detection in a memory system. A memory device is configured to set a field of a register with a first value when a read command has not been decoded, and with a second value when a read command is received and decoded. The value of the field is indicated to the host device, which can then decide whether to process information over the interface based on this indication.

  • Memory device sets a field of a register with a first value when a read command has not been decoded
  • If a read command is received and decoded, the memory device sets the field with a second value
  • The value of the field is indicated to the host device for decision-making on processing information over the interface

Potential Applications

The technology can be applied in various memory systems, such as computer memory, to ensure accurate processing of read commands and prevent errors in data retrieval.

Problems Solved

1. Detection of read command faults in memory systems 2. Ensuring accurate processing of read commands between host devices and memory devices

Benefits

1. Improved reliability in data retrieval processes 2. Prevention of errors in interpreting read commands 3. Enhanced communication between host devices and memory devices

Potential Commercial Applications

Optimizing memory systems in computers, servers, and other electronic devices to improve overall performance and reliability.

Possible Prior Art

There may be existing patents or technologies related to fault detection in memory systems, but specific prior art is not provided in the abstract.

Unanswered Questions

How does this technology compare to existing fault detection mechanisms in memory systems?

The article does not provide a direct comparison with existing fault detection mechanisms in memory systems. Further research or analysis would be needed to determine the specific advantages or differences.

What are the potential limitations or challenges in implementing this technology in memory systems?

The abstract does not address any potential limitations or challenges in implementing this technology. Additional information or research would be required to understand any obstacles that may arise during implementation.


Original Abstract Submitted

Methods, systems, and devices for read command fault detection in a memory system are described. For example, a memory device may be configured to set a field of a register with a first value, corresponding to a state where a read command has not been decoded. If the memory device receives and decodes a read command from a host device, the memory device may set the field with a second value. The memory device indicate a value of the field of the register to the host device, which may be used to evaluate whether to process information interpreted over an interface between the host device and the memory device. For example, if the host device receives an indication of the second value, the host device may proceed with processing and, if the host device receives an indication of the first value, the host device may refrain from processing.