18395879. ETCHING METHOD AND PLASMA PROCESSING APPARATUS simplified abstract (Tokyo Electron Limited)

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ETCHING METHOD AND PLASMA PROCESSING APPARATUS

Organization Name

Tokyo Electron Limited

Inventor(s)

Atsuki Hashimoto of Hwaseong-si (KR)

Sho Saitoh of Kurokawa-gun (JP)

Yoshimitsu Kon of Kurokawa-gun (JP)

ETCHING METHOD AND PLASMA PROCESSING APPARATUS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18395879 titled 'ETCHING METHOD AND PLASMA PROCESSING APPARATUS

Simplified Explanation: The patent application describes a method for etching a substrate with two regions, one containing a first material and the other containing a second material with silicon. A metal-containing deposition is formed on the first region using a first plasma, followed by etching the second region using a second plasma.

  • The method involves providing a substrate with two distinct regions, one with a first material and an opening, and the other with a second material containing silicon.
  • A metal-containing deposition is formed on the first region using a first plasma generated from a process gas containing halogen, metal, and carbon or hydrogen.
  • The second region is then etched through the opening using a second plasma generated from a different process gas than the first plasma.

Potential Applications: 1. Semiconductor manufacturing 2. Microelectronics fabrication 3. Nanotechnology research

Problems Solved: 1. Precise etching of different materials in a substrate 2. Improving the efficiency of metal depositions 3. Enhancing the quality of etched structures

Benefits: 1. Enhanced control over etching processes 2. Increased precision in material removal 3. Improved substrate quality and integrity

Commercial Applications: Advanced semiconductor manufacturing processes for high-tech industries such as electronics, telecommunications, and aerospace.

Questions about etching method: 1. How does the use of different plasmas improve the etching process? 2. What are the advantages of using a metal-containing deposition in this method?

Frequently Updated Research: Ongoing research in plasma technology and material science may lead to further advancements in etching methods for substrates with multiple regions.


Original Abstract Submitted

An etching method includes (a) providing a substrate including a first region and a second region below the first region, the first region containing a first material and including an opening, the second region containing a second material different from the first material, the second material containing silicon; (b) forming a metal-containing deposition on the first region by using first plasma generated from a first process gas containing halogen, metal, and at least one of carbon or hydrogen; and (c) after (b), etching the second region via the opening by using second plasma generated from a second process gas different from the first process gas.