18393850. SUBSTRATE SUPPORT APPARATUS simplified abstract (SEMES CO., LTD.)

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SUBSTRATE SUPPORT APPARATUS

Organization Name

SEMES CO., LTD.

Inventor(s)

Yong Park of Cheonan-si (KR)

SUBSTRATE SUPPORT APPARATUS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18393850 titled 'SUBSTRATE SUPPORT APPARATUS

Simplified Explanation:

The patent application describes a substrate support apparatus with two chucks, one supporting the substrate from the bottom and the other moving it horizontally by contacting the side surface.

  • The first chuck supports the substrate from the bottom surface.
  • The second chuck moves the substrate horizontally by contacting the side surface.
  • The second chuck is connected to the first chuck.
  • It has protruding pins on the top surface, with alignment pins on each pin.
  • The protruding pins are at the same horizontal distance from the center of the first chuck.

Key Features and Innovation:

  • Dual chuck system for substrate support and movement.
  • Protruding pins with alignment pins for precise positioning.
  • Horizontal movement capability for the substrate.

Potential Applications:

The technology can be used in semiconductor manufacturing, electronics assembly, and other industries requiring precise substrate handling.

Problems Solved:

The apparatus solves the problem of accurately supporting and moving substrates during manufacturing processes.

Benefits:

  • Improved accuracy in substrate handling.
  • Enhanced efficiency in manufacturing processes.
  • Reduced risk of substrate damage.

Commercial Applications:

The technology can be applied in industries such as semiconductor manufacturing, electronics production, and research laboratories for precise substrate handling.

Questions about Substrate Support Apparatus:

1. How does the dual chuck system improve substrate handling? 2. What are the potential benefits of using alignment pins in the chuck system?


Original Abstract Submitted

A substrate support apparatus includes a first chuck configured to support a substrate by contacting a bottom surface of the substrate, a second chuck configured to horizontally move the substrate by contacting a side surface of the substrate, wherein the second chuck includes a second chuck body coupled to the first chuck, a plurality of protruding pins vertically protruding from an outer portion of a top surface of the second chuck body, and an alignment pin vertically protruding from a top surface of each of the plurality of protruding pins, wherein the plurality of protruding pins are located at a same horizontal distance from a center of the first chuck.