18383182. MULTILAYER INNER SPACER FOR GATE-ALL-AROUND DEVICE simplified abstract (Applied Materials, Inc.)
Contents
- 1 MULTILAYER INNER SPACER FOR GATE-ALL-AROUND DEVICE
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 MULTILAYER INNER SPACER FOR GATE-ALL-AROUND DEVICE - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Semiconductor Devices
- 1.13 Original Abstract Submitted
MULTILAYER INNER SPACER FOR GATE-ALL-AROUND DEVICE
Organization Name
Inventor(s)
Sai Hooi Yeong of Cupertino CA (US)
Susmit Singha Roy of Campbell CA (US)
Abhijit Basu Mallick of Sunnyvale CA (US)
El Mehdi Bazizi of San Jose CA (US)
Benjamin Colombeau of San Jose CA (US)
MULTILAYER INNER SPACER FOR GATE-ALL-AROUND DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18383182 titled 'MULTILAYER INNER SPACER FOR GATE-ALL-AROUND DEVICE
Simplified Explanation
The patent application describes semiconductor devices, process tools, and methods for manufacturing gate-all-around (GAA) devices, as well as multilayer inner spacers for GAA devices. The multilayer inner spacer consists of an inner layer, a middle layer, and an outer layer in a superlattice structure on a substrate.
- Gate-all-around (GAA) devices
- Multilayer inner spacers
- Superlattice structure
- Semiconductor material layers
- Channel layers
Key Features and Innovation
- Semiconductor devices such as GAA devices
- Process tools for manufacturing GAA devices
- Methods for manufacturing GAA devices
- Multilayer inner spacers with superlattice structure
- Alternating semiconductor material layers and channel layers
Potential Applications
The technology can be applied in the manufacturing of advanced semiconductor devices with improved performance and efficiency.
Problems Solved
The technology addresses the need for more advanced and efficient semiconductor devices with multilayer inner spacers.
Benefits
- Enhanced performance of semiconductor devices
- Improved efficiency in manufacturing processes
- Potential for higher integration density
Commercial Applications
Title: Advanced Semiconductor Manufacturing Technology This technology can be used in the production of high-performance electronic devices, leading to advancements in various industries such as telecommunications, computing, and consumer electronics.
Prior Art
Readers can explore prior research on GAA devices, semiconductor manufacturing processes, and superlattice structures in semiconductor technology.
Frequently Updated Research
Researchers are continually exploring new methods and materials for enhancing semiconductor device performance and efficiency.
Questions about Semiconductor Devices
What are the potential benefits of using multilayer inner spacers in semiconductor devices?
Using multilayer inner spacers can improve device performance, efficiency, and integration density.
How does the superlattice structure in the multilayer inner spacer contribute to the functionality of semiconductor devices?
The superlattice structure enhances the properties of the semiconductor material layers and channel layers, leading to improved device performance.
Original Abstract Submitted
Semiconductor devices (e.g., gate-all-around (GAA) devices), process tools for manufacturing GAA devices and methods of manufacturing GAA devices and multilayer inner spacers for GAA devices are described. The multilayer inner spacer comprises an inner layer, a middle layer, and an outer layer within a superlattice structure formed on a top surface of a substrate. The superlattice structure has a plurality of semiconductor material layers (e.g., silicon germanium (SiGe)) and a corresponding plurality of channel layers (e.g., silicon (Si)) alternatingly arranged in a plurality of stacked pairs. In some embodiments, the methods are performed in situ in an integrated deposition and etch processing system.
- Applied Materials, Inc.
- Sai Hooi Yeong of Cupertino CA (US)
- Liu Jiang of Dublin CA (US)
- Susmit Singha Roy of Campbell CA (US)
- Abhijit Basu Mallick of Sunnyvale CA (US)
- El Mehdi Bazizi of San Jose CA (US)
- Benjamin Colombeau of San Jose CA (US)
- H01L29/423
- H01L21/8238
- H01L27/092
- H01L29/06
- H01L29/66
- H01L29/775
- H01L29/786
- CPC H01L29/42392