18373747. METHOD AND ELECTRONIC DEVICE FOR GENERATING POINT CLOUD simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

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METHOD AND ELECTRONIC DEVICE FOR GENERATING POINT CLOUD

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Dongchan Kim of Suwon-si (KR)

Dongnam Byun of Suwon-si (KR)

Jaewook Shin of Suwon-si (KR)

Jinyoung Hwang of Suwon-si (KR)

METHOD AND ELECTRONIC DEVICE FOR GENERATING POINT CLOUD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18373747 titled 'METHOD AND ELECTRONIC DEVICE FOR GENERATING POINT CLOUD

Simplified Explanation

The patent application describes a method and electronic device for generating a point cloud by using sensor data and artificial intelligence to identify outlier points in the point cloud.

  • The method involves obtaining sensing data from a sensor, generating a point cloud based on the data, using AI models to identify outlier points indicating rule violations, and providing a guide for re-photographing the object based on the outlier points.

Potential Applications

  • 3D scanning and modeling
  • Quality control in manufacturing
  • Augmented reality applications

Problems Solved

  • Efficient identification of outlier points in point clouds
  • Improved accuracy in object scanning and modeling
  • Streamlining re-photographing processes

Benefits

  • Enhanced data accuracy
  • Time and cost savings in re-photographing
  • Increased efficiency in object scanning

Potential Commercial Applications

Enhancing 3D Scanning Technology for Improved Object Modeling

Possible Prior Art

There are existing methods for generating point clouds and using AI for data analysis in various industries such as robotics, autonomous vehicles, and computer vision.

Unanswered Questions

How does the method handle complex objects with intricate details?

The patent application does not specify how the method deals with complex objects that may have intricate details that could affect the generation of the point cloud.

What are the limitations of using AI models for outlier detection in point clouds?

The patent application does not address the potential limitations or challenges of using AI models for outlier detection in point clouds, such as accuracy issues or computational requirements.


Original Abstract Submitted

Provided are a method and an electronic device for generating a point cloud. The method includes obtaining, from at least one sensor of the electronic device, first sensing data corresponding to an object, obtaining a first point cloud corresponding to the object, based on the first sensing data, identifying, by using at least one artificial intelligence model, at least one outlier point indicating violation of at least one predefined rule in the first point cloud, and providing a re-photographing location guide for re-photographing the object, based on the at least one outlier point.