18369350. SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME simplified abstract (Samsung Display Co., LTD.)
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SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME
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SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 18369350 titled 'SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME
The abstract of the patent application describes a scan driver with multiple stages, each containing various control circuits for managing voltages and signals to generate a scan signal.
- The scan driver includes control circuits for first, second, third, and fourth nodes, as well as an inverted carry node, to regulate voltages and signals throughout the stages.
- The carry output circuit is responsible for outputting a carry signal.
- The second node control circuit adjusts the voltage of the second node based on the carry signal, an enable signal, and the voltage of the inverted carry node.
- The third node control circuit manages the voltage of the third node using inputs from the second and fourth nodes.
- The scan output circuit produces the final scan signal based on the voltages of the third and fourth nodes.
Potential Applications: - Integrated circuits - Semiconductor devices - Digital signal processing systems
Problems Solved: - Efficient voltage control in scan drivers - Accurate signal output generation
Benefits: - Improved performance in scan testing - Enhanced reliability in data transmission
Commercial Applications: Title: "Advanced Scan Driver Technology for Semiconductor Testing" This technology can be utilized in the semiconductor industry for testing and quality control purposes, leading to more reliable and efficient production processes.
Prior Art: Readers can explore prior patents related to scan drivers, voltage control circuits, and digital signal processing systems to gain a deeper understanding of the technology landscape.
Frequently Updated Research: Researchers are constantly exploring new ways to optimize scan drivers for better performance and reliability in semiconductor testing applications.
Questions about Scan Driver Technology: 1. How does the scan driver technology improve the efficiency of semiconductor testing processes? 2. What are the key differences between traditional voltage control circuits and the control circuits used in this scan driver technology?
Original Abstract Submitted
A scan driver includes: stages. Each stage includes: a first node control circuit for controlling a voltage of a first node; an inverted carry node control circuit for controlling a voltage of an inverted carry node; a carry output circuit for outputting a carry signal; a fourth node control circuit for controlling a voltage of a fourth node in response to the carry signal; a second node control circuit for controlling a voltage of a second node in response to the carry signal, an enable signal, and the voltage of the inverted carry node; a third node control circuit for controlling a voltage of a third node in response to the voltage of the second node and the voltage of the fourth node; and a scan output circuit for outputting a scan signal in response to the voltage of the third node and the voltage of the fourth node.
