18367540. INSPECTION APPARATUS AND METHOD simplified abstract (SAMSUNG DISPLAY CO., LTD.)
Contents
INSPECTION APPARATUS AND METHOD
Organization Name
Inventor(s)
TAE-JIN Hwang of Yongin-si (KR)
SE-KWANG Han of Yongin-si (KR)
SEONGHYEON Cheon of Yongin-si (KR)
INSPECTION APPARATUS AND METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18367540 titled 'INSPECTION APPARATUS AND METHOD
The patent application describes inspection apparatuses and methods involving a light source, an inspection module, and a separator to examine objects with different parts.
- The inspection apparatus includes a light source that emits a beam towards an inspection object with distinct parts.
- An inspection module, located away from the object, receives the beam after it interacts with the inspection object.
- A separator, positioned between the object and the module, allows the beam to pass through while altering its path.
- The separator consists of a frame with an opening and a separation member that changes the beam's trajectory as it passes through.
Potential Applications:
- Quality control in manufacturing processes
- Non-destructive testing in various industries
- Inspection of complex objects with multiple components
Problems Solved:
- Efficient and accurate inspection of objects with different parts
- Minimization of errors in inspection processes
- Enhanced visibility and analysis of object components
Benefits:
- Improved inspection accuracy and reliability
- Time and cost savings in quality control procedures
- Enhanced safety in testing and examination processes
Commercial Applications:
- Industrial manufacturing for quality assurance
- Aerospace and automotive industries for component inspection
- Medical field for non-invasive testing and diagnostics
Questions about the technology: 1. How does the separator in the inspection apparatus contribute to the accuracy of the inspection process? 2. What are the potential limitations of using this inspection method in different industries?
Original Abstract Submitted
Disclosed are inspection apparatuses and methods. The inspection apparatus includes a light source configured to irradiate a beam to an inspection object including a first part and a second part different from the first part; an inspection module spaced apart from the inspection object and onto which a beam, whose path is changed after being irradiated to the inspection object, is incident; and a separator between the inspection object and the inspection module and through which at least a portion of the beam, whose path is changed, passes. The separator includes: a frame in which an opening is defined, and a separation member in the opening and configured to change a path of a beam, which passes through the separator.
