18325109. STORAGE DEVICE AND OPERATING METHOD THEREOF simplified abstract (SK hynix Inc.)

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STORAGE DEVICE AND OPERATING METHOD THEREOF

Organization Name

SK hynix Inc.

Inventor(s)

Sung Yeob Cho of Gyeonggi-do (KR)

STORAGE DEVICE AND OPERATING METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 18325109 titled 'STORAGE DEVICE AND OPERATING METHOD THEREOF

Simplified Explanation

The patent application describes a storage device that can prevent characteristic degradation at low temperatures and reduce failures by controlling internal current consumption based on leakage current information stored in the device.

  • The storage device includes a memory device.
  • It has a leakage current information storage for storing information related to leakage current based on temperature range.
  • A current controller is used to control internal current consumption based on the stored leakage current information when the memory device's temperature is equal to or lower than a certain threshold.

Key Features and Innovation

  • Storage device prevents characteristic degradation at low temperatures.
  • Reduces failures by controlling internal current consumption based on leakage current information.
  • Enhances reliability and performance of the memory device.

Potential Applications

The technology can be applied in:

  • Data centers
  • Consumer electronics
  • Automotive systems

Problems Solved

  • Prevents characteristic degradation at low temperatures.
  • Reduces failures in storage devices.
  • Improves overall reliability and performance.

Benefits

  • Enhanced reliability of storage devices.
  • Improved performance at low temperatures.
  • Reduced risk of failures.

Commercial Applications

Title: "Enhanced Reliability Storage Devices for Various Applications" This technology can be used in various commercial applications such as:

  • Industrial IoT devices
  • Aerospace systems
  • Medical equipment

Prior Art

Readers can explore prior art related to this technology by researching:

  • Memory device temperature control systems
  • Leakage current management in storage devices

Frequently Updated Research

Stay updated on the latest research related to:

  • Memory device reliability enhancements
  • Current consumption control in storage devices

Questions about Storage Device Technology

How does the storage device prevent characteristic degradation at low temperatures?

The storage device prevents characteristic degradation by controlling internal current consumption based on leakage current information stored in the device.

What are the potential commercial applications of this technology?

The technology can be applied in various industries such as data centers, consumer electronics, and automotive systems.


Original Abstract Submitted

A storage device is provided which is capable of preventing characteristic degradation of the storage device at low temperature and reducing a failure. The storage device includes a memory device; a leakage current information storage for storing information associated with a leakage current generated based on a temperaturerange of the memory device; and a current controller for controlling the current internally consumed, based on the information associated with the leakage current, when a current temperature of the memory device is equal to or lower than a first temperature.