18323427. SEMICONDUCTOR DEVICE HAVING A LOW-K GATE SIDE INSULATING LAYER simplified abstract (SK hynix Inc.)

From WikiPatents
Jump to navigation Jump to search

SEMICONDUCTOR DEVICE HAVING A LOW-K GATE SIDE INSULATING LAYER

Organization Name

SK hynix Inc.

Inventor(s)

Young Gwang Yoon of Gyeonggi-do (KR)

SEMICONDUCTOR DEVICE HAVING A LOW-K GATE SIDE INSULATING LAYER - A simplified explanation of the abstract

This abstract first appeared for US patent application 18323427 titled 'SEMICONDUCTOR DEVICE HAVING A LOW-K GATE SIDE INSULATING LAYER

Simplified Explanation

The semiconductor device described in the patent application includes a gate structure with spacers on both side surfaces, an interfacial insulating layer, a gate dielectric layer, a gate barrier layer, gate side insulating layers, and a gate electrode. The gate dielectric layer has a U-shaped longitudinal cross-sectional shape and is in contact with the inner side surfaces of the spacers, surrounding the gate barrier layer. The gate side insulating layers surround the outer side surfaces of the gate barrier layer.

  • Gate structure with spacers and multiple insulating layers
  • U-shaped gate dielectric layer surrounding gate barrier layer

Potential Applications

The technology described in the patent application could be applied in:

  • Semiconductor manufacturing
  • Integrated circuits

Problems Solved

This technology helps to:

  • Improve gate structure performance
  • Enhance semiconductor device reliability

Benefits

The benefits of this technology include:

  • Better control of gate structure properties
  • Increased efficiency in semiconductor devices

Potential Commercial Applications

The technology could be used in various commercial applications such as:

  • Electronics industry
  • Telecommunications sector

Possible Prior Art

One possible prior art for this technology could be:

  • Previous patents related to gate structures in semiconductor devices

Unanswered Questions

How does this technology compare to existing gate structure designs in terms of performance and reliability?

The article does not provide a direct comparison with existing gate structure designs.

Are there any limitations or drawbacks associated with implementing this technology in semiconductor devices?

The article does not mention any limitations or drawbacks of using this technology.


Original Abstract Submitted

A semiconductor device includes a gate structure crossing an active region of a substrate, and spacers formed on both side surfaces of the gate structure. The gate structure includes an interfacial insulating layer formed on the substrate, a gate dielectric layer formed on the interfacial insulating layer, a gate barrier layer and gate side insulating layers formed on the gate dielectric layer, and a gate electrode on the gate barrier layer. The gate dielectric layer is in contact with inner side surfaces of the spacers, and has a U-shaped longitudinal cross-sectional shape to surround a lower surface and some portions of side surfaces of the gate barrier layer. The gate side insulating layers surround outer side surfaces of the gate barrier layer.