18258033. IMAGING APPARATUS simplified abstract (Sony Semiconductor Solutions Corporation)
Contents
IMAGING APPARATUS
Organization Name
Sony Semiconductor Solutions Corporation
Inventor(s)
IMAGING APPARATUS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18258033 titled 'IMAGING APPARATUS
Simplified Explanation
An imaging apparatus with multi-spectral sensor for exposure control based on spectral characteristics of desired object.
- Multi-spectral sensor outputs multiple wavelength signals.
- Detection circuit detects luminance signal based on spectral characteristic of desired object.
- Control circuit performs exposure control based on spectral characteristic of desired object.
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- Potential Applications
- Medical imaging for detecting specific tissues or abnormalities based on spectral characteristics.
- Agricultural monitoring to assess plant health and growth based on spectral reflectance.
- Remote sensing for environmental monitoring and resource management based on spectral signatures.
- Problems Solved
- Accurate exposure control based on spectral characteristics of desired object.
- Improved image quality and detection of specific features.
- Enhanced performance in various imaging applications.
- Benefits
- Precise exposure control leads to better image quality.
- Increased accuracy in detecting specific objects or features.
- Versatile applications in different fields such as medical, agriculture, and environmental monitoring.
Original Abstract Submitted
An imaging apparatus according to the present disclosure includes a multi-spectral sensor that outputs multiple wavelength signals, a detection circuit that detects a luminance signal in accordance with a spectral characteristic of a desired object on the basis of a detection signal generated using the multiple wavelength signals outputted from the multi-spectral sensor, and a control circuit that performs exposure control in accordance with the spectral characteristic of the desired object on the basis of a detection value of the detection circuit.
