18220672. PROBE AND INSPECTION APPARATUS INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)

PROBE AND INSPECTION APPARATUS INCLUDING THE SAME

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Junbum Park of Suwon-si (KR)

Namil Koo of Suwon-si (KR)

Jaeho Kim of Suwon-si (KR)

Jongsu Kim of Suwon-si (KR)

Suhwan Park of Suwon-si (KR)

Sangwoo Bae of Suwon-si (KR)

Inkeun Baek of Suwon-si (KR)

Ikseon Jeon of Suwon-si (KR)

Martin Priwisch of Suwon-si (KR)

PROBE AND INSPECTION APPARATUS INCLUDING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18220672 titled 'PROBE AND INSPECTION APPARATUS INCLUDING THE SAME

Simplified Explanation

The inspection apparatus described in the patent application includes a substrate that extends in two perpendicular directions. It also includes a receiver antenna with two antenna electrodes, a first waveguide, and a second waveguide. The first antenna electrode overlaps the first waveguide in a third direction, while the second antenna electrode overlaps the second waveguide in the same third direction.

• The inspection apparatus includes a substrate, receiver antenna, and waveguides.
• The receiver antenna has two antenna electrodes.
• The first antenna electrode overlaps the first waveguide.
• The second antenna electrode overlaps the second waveguide.
• The overlapping occurs in a third direction perpendicular to the first and second directions.

Potential Applications:

• Non-destructive testing and inspection of materials and structures.
• Quality control in manufacturing processes.
• Detection of defects or abnormalities in products or components.

Problems Solved:

• Enables efficient and accurate inspection of materials and structures.
• Facilitates non-destructive testing, reducing the need for destructive methods.
• Enhances quality control by detecting defects or abnormalities early on.

Benefits:

• Improved inspection accuracy and efficiency.
• Non-destructive testing minimizes material waste and costs.
• Early detection of defects leads to better product quality and reliability.

Original Abstract Submitted

An inspection apparatus is provided. The inspection apparatus includes a substrate extending in a first direction and a second direction perpendicular to the first direction, a receiver antenna arranged on the substrate and including first and second antenna electrodes, a first waveguide on the substrate, and a second waveguide on the substrate, wherein the first antenna electrode overlaps the first waveguide in a third direction that is perpendicular to the first direction and the second direction, and the second antenna electrode overlaps the second waveguide in the third direction.