18215533. VERTICAL NAND FLASH MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
VERTICAL NAND FLASH MEMORY DEVICE
Organization Name
Inventor(s)
Seungdam Hyun of Suwon-si (KR)
Hyungyung Kim of Suwon-si (KR)
Kwangmin Park of Suwon-si (KR)
Seungyeul Yang of Suwon-si (KR)
Seokhoon Choi of Suwon-si (KR)
VERTICAL NAND FLASH MEMORY DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18215533 titled 'VERTICAL NAND FLASH MEMORY DEVICE
The abstract describes a vertical NAND flash memory device with multiple cell arrays, each containing a channel layer, a charge trap layer with a matrix of dielectric and charge trap material, and gate electrodes.
- Vertical NAND flash memory device with multiple cell arrays
- Each cell array includes a channel layer, charge trap layer, and gate electrodes
- Charge trap layer contains a matrix of dielectric and charge trap material
- Charge trap layer includes anti-ferroelectric nanocrystals or ferroelectric nanocrystals
Potential Applications: - Data storage devices - Solid-state drives - Mobile devices - Embedded systems
Problems Solved: - Increased data storage capacity - Enhanced data retention and reliability - Improved performance and speed
Benefits: - Higher storage density - Faster data access - Enhanced data security
Commercial Applications: Title: "Innovative Vertical NAND Flash Memory for High-Performance Data Storage" This technology can be used in various commercial applications such as consumer electronics, enterprise storage solutions, and data centers, catering to the growing demand for high-speed and high-capacity storage solutions.
Questions about the technology: 1. How does the inclusion of anti-ferroelectric nanocrystals or ferroelectric nanocrystals in the charge trap layer impact the performance of the vertical NAND flash memory device? 2. What are the specific advantages of using a matrix of dielectric and charge trap material in the charge trap layer of the cell arrays?
Original Abstract Submitted
A vertical NAND flash memory device includes a plurality of cell arrays, where each cell array of the plurality of cell arrays includes a channel layer, a charge trap layer provided on the channel layer, the charge trap layer including a matrix comprising a dielectric and a charge trap material in the matrix and including anti-ferroelectric nanocrystals or ferroelectric nanocrystals, and a plurality of gate electrodes provided on the charge trap layer.
- SAMSUNG ELECTRONICS CO., LTD.
- Seungdam Hyun of Suwon-si (KR)
- Kyunghun Kim of Suwon-si (KR)
- Sunho Kim of Suwon-si (KR)
- Hyungyung Kim of Suwon-si (KR)
- Kwangmin Park of Suwon-si (KR)
- Seungyeul Yang of Suwon-si (KR)
- Gukhyon Yon of Suwon-si (KR)
- Minhyun Lee of Suwon-si (KR)
- Seokhoon Choi of Suwon-si (KR)
- Hoseok Heo of Suwon-si (KR)
- H10B43/35
- G11C16/04
- H01L29/423
- H10B43/10
- H10B43/27
- CPC H10B43/35