18204972. STORAGE DEVICES DETECTING INTERNAL TEMPERATURE AND DEFECTS BY USING TEMPERATURE SENSORS AND METHODS OF OPERATING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
STORAGE DEVICES DETECTING INTERNAL TEMPERATURE AND DEFECTS BY USING TEMPERATURE SENSORS AND METHODS OF OPERATING THE SAME
Organization Name
Inventor(s)
Younsoo Cheon of Suwon-si (KR)
STORAGE DEVICES DETECTING INTERNAL TEMPERATURE AND DEFECTS BY USING TEMPERATURE SENSORS AND METHODS OF OPERATING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 18204972 titled 'STORAGE DEVICES DETECTING INTERNAL TEMPERATURE AND DEFECTS BY USING TEMPERATURE SENSORS AND METHODS OF OPERATING THE SAME
Simplified Explanation
The patent application describes a storage device with a temperature sensor and measurement circuit to monitor temperature and detect damage to the sensor.
- Non-volatile memory for storing data
- Temperature sensor with resistance that changes based on temperature
- Temperature measurement circuit with multiple transistors with different threshold voltages
- Circuit applies current to sensor and generates information on temperature or damage based on output current from transistors
- Potential Applications:
- Data storage devices
- Electronic devices with temperature monitoring needs
- Industrial equipment with temperature-sensitive components
- Problems Solved:
- Accurate temperature monitoring
- Early detection of sensor damage
- Preventing overheating in devices
- Benefits:
- Improved device reliability
- Enhanced data storage performance
- Cost-effective temperature management
Original Abstract Submitted
A storage device including a non-volatile memory for storing data, a temperature sensor having resistance that changes according to temperature of the temperature sensor, and a temperature measurement circuit including a plurality of transistors, which are turned on or off based on a current of the temperature sensor and have different threshold voltages from one another. The temperature management circuit may be configured to apply a current to the temperature sensor and generate information indicating the temperature of the temperature sensor or indicating damage to the temperature sensor based on an output current obtained from the plurality of transistors.
