18194082. METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS simplified abstract (Samsung Electronics Co., Ltd.)

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METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS

Organization Name

Samsung Electronics Co., Ltd.

Inventor(s)

Jae-Eon Jo of Suwon-si (KR)

Rohyoung Myung of Suwon-si (KR)

Hans Gustav Åhlman of Suwon-si (KR)

METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18194082 titled 'METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS

The abstract of the patent application describes an electronic device that can install instrumentation points in different tasks of an application, allowing for the measurement of causal relationships between these points based on observed delays.

  • The electronic device includes one or more processors and a memory storing instructions.
  • It installs instrumentation points in source and target tasks of an application that run in parallel.
  • The device measures the causal relationship between the source and target instrumentation points by observing delays induced by the source point.

Potential Applications: - Performance optimization of parallel tasks in applications - Debugging and troubleshooting of software systems - Monitoring and analyzing the behavior of concurrent processes

Problems Solved: - Identifying and quantifying causal relationships between different tasks in parallel execution - Improving the efficiency and reliability of software applications - Enhancing the overall performance of electronic devices

Benefits: - Enhanced understanding of task dependencies in parallel computing - Improved debugging capabilities for complex software systems - Increased efficiency and performance optimization in electronic devices

Commercial Applications: Title: "Advanced Parallel Task Analysis Technology for Software Development" This technology can be utilized in industries such as software development, cloud computing, and data analytics to enhance performance and optimize task execution in parallel computing environments.

Prior Art: Researchers and developers can explore prior art related to parallel task analysis, instrumentation points, and causal relationship measurement in software systems to further understand the novelty of this technology.

Frequently Updated Research: Stay updated on the latest advancements in parallel computing, task analysis, and performance optimization in software development to leverage cutting-edge technologies for enhanced efficiency and reliability.

Questions about the Technology: 1. How does the electronic device measure the causal relationship between the source and target instrumentation points? - The device determines this relationship based on observed delays induced by the source instrumentation point. 2. What are the potential real-world applications of this technology in various industries? - This technology can be applied in software development, cloud computing, and data analytics for performance optimization and task analysis.


Original Abstract Submitted

An electronic device includes: one or more processors; a memory storing instructions configured to cause the one or more processors to: install instrumentation points in respective tasks of an application, the instrumentation points including a source instrumentation point installed in a source task and a target instrumentation point installed in a target task, wherein the source task and the target task are configured to execute in parallel on the one or more processors, and wherein each task includes a respective sequence of instructions executable by the one or more processors, and determine a measure of a causal relationship between the source instrumentation point and the target instrumentation point based on observation of a delay in the target instrumentation point induced by a delay amount generated by the source instrumentation point.