18194082. METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
Contents
- 1 METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS
Organization Name
Inventor(s)
Rohyoung Myung of Suwon-si (KR)
Hans Gustav Åhlman of Suwon-si (KR)
METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18194082 titled 'METHOD AND DEVICE FOR FINDING CAUSALITY BETWEEN APPLICATION INSTRUMENTATION POINTS
Simplified Explanation
The abstract describes an electronic device that installs instrumentation points in tasks of an application to determine a causal relationship between them based on observed delays.
- One or more processors
- Memory storing instructions
- Installation of instrumentation points in tasks
- Source and target instrumentation points
- Determination of causal relationship based on observed delays
Potential Applications
This technology could be applied in:
- Performance optimization of parallel tasks
- Debugging and troubleshooting software applications
- Analyzing dependencies between tasks in a system
Problems Solved
This technology helps in:
- Identifying and resolving performance bottlenecks
- Understanding the impact of one task on another in parallel processing
- Improving overall system efficiency and reliability
Benefits
The benefits of this technology include:
- Enhanced performance tuning capabilities
- Increased system stability and predictability
- Efficient resource allocation in parallel processing environments
Potential Commercial Applications
This technology could be valuable in:
- Software development tools for performance analysis
- Cloud computing platforms for optimizing task execution
- High-performance computing systems for improving parallel processing efficiency
Possible Prior Art
One possible prior art could be existing performance monitoring tools that track task execution times and dependencies in software applications.
Unanswered Questions
How does this technology handle complex dependencies between multiple tasks in a system?
This technology uses observed delays to determine causal relationships between tasks, but it may face challenges in analyzing intricate dependencies in highly complex systems. Further research and development may be needed to address this issue.
Can this technology be applied to real-time systems with strict timing requirements?
While this technology focuses on analyzing delays between tasks, its applicability to real-time systems with stringent timing constraints is unclear. Additional testing and validation would be necessary to assess its suitability for such environments.
Original Abstract Submitted
An electronic device includes: one or more processors; a memory storing instructions configured to cause the one or more processors to: install instrumentation points in respective tasks of an application, the instrumentation points including a source instrumentation point installed in a source task and a target instrumentation point installed in a target task, wherein the source task and the target task are configured to execute in parallel on the one or more processors, and wherein each task includes a respective sequence of instructions executable by the one or more processors, and determine a measure of a causal relationship between the source instrumentation point and the target instrumentation point based on observation of a delay in the target instrumentation point induced by a delay amount generated by the source instrumentation point.