18189859. BUILT-IN SELF-TEST ENHANCEMENTS simplified abstract (QUALCOMM Incorporated)
Contents
BUILT-IN SELF-TEST ENHANCEMENTS
Organization Name
Inventor(s)
Saksham Tandon of Bangalore (IN)
BUILT-IN SELF-TEST ENHANCEMENTS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18189859 titled 'BUILT-IN SELF-TEST ENHANCEMENTS
The present disclosure involves a method that includes obtaining built-in self-test (BIST) patterns, applying a compression scheme to generate compressed BIST patterns, and storing the compressed BIST patterns.
- BIST patterns are obtained, each containing a series of instructions.
- A compression scheme is applied to generate compressed BIST patterns.
- The compression scheme encodes operations and data fields of instructions to create encoded instructions.
- Encoded instructions have an identifier (ID) field and a variable number of data bytes.
- The ID field identifies the type of operation and indicates the variable number of data bytes.
Potential Applications: - This technology can be used in the semiconductor industry for testing integrated circuits. - It can also be applied in the telecommunications sector for testing network equipment.
Problems Solved: - Efficient compression of BIST patterns for storage and transmission. - Simplification of BIST pattern generation and storage.
Benefits: - Reduced storage space required for BIST patterns. - Improved efficiency in testing processes. - Enhanced reliability of test results.
Commercial Applications: Title: "Efficient BIST Pattern Compression Technology for Semiconductor Testing" This technology can be utilized by semiconductor companies to streamline their testing processes, leading to cost savings and improved product quality. It can also be licensed to telecommunications companies for testing network equipment.
Questions about BIST Pattern Compression Technology: 1. How does the compression scheme encode operations and data fields in the instructions? 2. What are the potential challenges in implementing this technology in different industries?
Frequently Updated Research: Researchers are continuously exploring new compression algorithms and techniques to further enhance the efficiency of BIST pattern compression technology. Stay updated on the latest advancements in this field to leverage the benefits of cutting-edge compression schemes.
Original Abstract Submitted
Aspects of the present disclosure provide a method generally including obtaining one or more built-in self-test (BIST) patterns, each pattern including a series of instructions, applying a compression scheme to generate one or more compressed BIST patterns, wherein the compression scheme encodes an operation and data field of instructions to generate encoded instructions, each encoded instruction having an identifier (ID) field and a variable number of data bytes, wherein the ID field identifies a type of the operation and indicates the variable number of data bytes, and storing the compressed BIST patterns.
