18183446. APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF
Organization Name
Inventor(s)
Seongkwan Lee of Suwon-si (KR)
Cheolmin Park of Suwon-si (KR)
APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF - A simplified explanation of the abstract
This abstract first appeared for US patent application 18183446 titled 'APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF
Simplified Explanation
The abstract describes an apparatus for testing an image sensor that includes a load resistor and parametric measuring units to correct errors during testing.
- Apparatus for testing an image sensor
- Includes load resistor, first and second switches, and parametric measuring units
- First switch connected to first signal line and first end of load resistor
- Second switch connected to second signal line and second end of load resistor
- Parametric measuring units correct errors of load resistor during testing operation
Potential Applications
- Testing and calibration of image sensors in manufacturing processes
- Quality control in the production of electronic devices with image sensors
Problems Solved
- Ensures accurate testing of image sensors by correcting errors in the load resistor
- Improves reliability and consistency of test results for image sensors
Benefits
- Increased accuracy in testing image sensors
- Enhanced quality control in manufacturing processes
- Improved performance and reliability of electronic devices with image sensors
Original Abstract Submitted
An apparatus for testing an image sensor includes a load resistor, a first switch configured to be electrically connected to a first signal line of a device under test and a first end of the load resistor, a second switch configured to be electrically connected to a second signal line of the device under test and a second end of the load resistor, a first parametric measuring unit electrically connected to the first switch, and a second parametric measuring unit electrically connected to the second switch. At least one of the first parametric measuring unit and the second parametric unit is configured to correct an error of the load resistor during a testing operation of an output voltage of the device under test.
