18148619. Using Cleaning Protocols to Monitor Defects Associated with Light Detection and Ranging (Lidar) Devices simplified abstract (WAYMO LLC)

Using Cleaning Protocols to Monitor Defects Associated with Light Detection and Ranging (Lidar) Devices

Organization Name

WAYMO LLC

Inventor(s)

Lucas Peeters of Palo Alto CA (US)

Chase Salsbury of San Mateo CA (US)

Kanika Sachdev of Sunnyvale CA (US)

Luke Wachter of San Francisco CA (US)

Tadeusz Pudlik of Mountain View CA (US)

Caner Onal of Palo Alto CA (US)

Logan Su of Palo Alto CA (US)

Using Cleaning Protocols to Monitor Defects Associated with Light Detection and Ranging (Lidar) Devices - A simplified explanation of the abstract

This abstract first appeared for US patent application 18148619 titled 'Using Cleaning Protocols to Monitor Defects Associated with Light Detection and Ranging (Lidar) Devices

Simplified Explanation: The patent application relates to using cleaning protocols to monitor defects in lidar devices. A method involves applying a cleaning protocol to optical components, emitting light signals, detecting reflections, and determining defects based on the detected reflections.

Key Features and Innovation:

• Monitoring defects in lidar devices using cleaning protocols
• Applying cleaning protocols to optical components
• Emitting light signals and detecting reflections
• Determining defects based on detected reflections

Potential Applications: This technology can be used in various industries such as automotive, robotics, and surveillance for accurate and reliable lidar data collection.

Problems Solved: This technology addresses the issue of monitoring defects in lidar devices, ensuring optimal performance and accuracy in data collection.

Benefits:

• Improved performance and accuracy of lidar devices
• Early detection of defects for timely maintenance
• Enhanced reliability of lidar data for various applications

Commercial Applications: Potential commercial applications include autonomous vehicles, industrial automation, security systems, and environmental monitoring.

Prior Art: Readers can explore prior art related to lidar technology, cleaning protocols, and defect monitoring in optical devices to understand the background of this innovation.

Frequently Updated Research: Stay updated on research related to lidar technology advancements, cleaning protocols, and defect monitoring in optical components for the latest developments in the field.

Questions about Lidar Defect Monitoring: 1. What are the key benefits of using cleaning protocols to monitor defects in lidar devices? 2. How does this technology improve the reliability of lidar data collection?

Original Abstract Submitted

Example embodiments relate to using cleaning protocols to monitor defects associated with light detection and ranging (lidar) devices. An example embodiment includes a method. The method includes applying, using a cleaning device, a cleaning protocol to one or more optical components of a light detection and ranging (lidar) device. The method also includes emitting, from a light emitter of the lidar device, one or more light signals. Additionally, the method includes detecting, by a light detector of the lidar device, reflections of the one or more light signals. Further, the method includes determining, by a controller of the lidar device based on the detected reflections of the one or more light signals, that one or more defects are present within the one or more optical components or within the cleaning device.