18121430. MULTI-MEASUREMENT PROBE ASSEMBLY simplified abstract (Raytheon Technologies Corporation)

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MULTI-MEASUREMENT PROBE ASSEMBLY

Organization Name

Raytheon Technologies Corporation

Inventor(s)

Eli Warren of Wethersfield CT (US)

Bryan J. Hackett of Berlin CT (US)

MULTI-MEASUREMENT PROBE ASSEMBLY - A simplified explanation of the abstract

This abstract first appeared for US patent application 18121430 titled 'MULTI-MEASUREMENT PROBE ASSEMBLY

The patent application describes a measurement system comprising a probe housing, a field probe, and an optical probe. The field probe includes a field sensor in a cavity, while the optical probe has a line of sight through a channel into the volume near the sensor face.

  • The measurement system includes a probe housing with a sidewall, a cavity, and a channel.
  • The field probe contains a field sensor positioned in the cavity, forming a sensor face.
  • An optical probe is configured to have an optical line of sight through the channel into the area adjacent to the sensor face.

Potential Applications: - Industrial process monitoring - Environmental monitoring - Scientific research

Problems Solved: - Accurate and precise measurements in challenging environments - Integration of optical and field sensing technologies

Benefits: - Enhanced measurement accuracy - Improved data collection in complex settings - Versatile applications in various industries

Commercial Applications: Title: Advanced Measurement System for Industrial Monitoring This technology can be utilized in industries such as manufacturing, agriculture, and environmental monitoring to enhance data collection and analysis processes, leading to improved efficiency and productivity.

Questions about the technology: 1. How does the integration of field and optical probes improve measurement accuracy? 2. What are the key advantages of having a line of sight through the channel in the optical probe?


Original Abstract Submitted

A measurement system is provided that includes a probe housing, a field probe and an optical probe. The probe housing includes a sidewall, a cavity and a channel. The sidewall extends circumferentially around and axially along the cavity. The channel is radially outboard of the cavity and extends axially in the sidewall. The field probe includes a field sensor disposed in the cavity. The field sensor forms a sensor face. The optical probe is configured with an optical line of sight through the channel into a volume adjacent the sensor face.

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