18113165. SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD simplified abstract (Samsung Electronics Co., Ltd.)
Contents
- 1 SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD
Organization Name
Inventor(s)
KYUNGJIN Park of SUWON-SI (KR)
SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18113165 titled 'SEMICONDUCTOR DEVICE AND RETENTION TEST METHOD
Simplified Explanation
The semiconductor device described in the abstract includes a memory test circuit, a memory device, and a test logic. The memory test circuit generates a signal based on the logic levels of two other signals. The memory device's activity is determined by the signal from the memory test circuit. The test logic performs a retention test on the memory device based on the logic level of one of the signals.
- Memory test circuit outputs a signal based on logic levels of two other signals
- Memory device's activity is controlled by the signal from the memory test circuit
- Test logic performs a retention test on the memory device based on the logic level of one of the signals
Potential Applications
The technology described in the patent application could be applied in:
- Memory testing equipment
- Semiconductor manufacturing
Problems Solved
This technology helps in:
- Ensuring memory device functionality
- Improving memory device reliability
Benefits
The benefits of this technology include:
- Enhanced memory testing capabilities
- Increased reliability of memory devices
Potential Commercial Applications
The potential commercial applications of this technology could be in:
- Semiconductor industry
- Electronics manufacturing
Possible Prior Art
One possible prior art for this technology could be:
- Memory test circuits used in semiconductor devices
Unanswered Questions
How does this technology compare to existing memory testing methods?
This technology offers a more efficient and reliable way to test memory devices compared to traditional methods.
What impact could this technology have on the semiconductor industry?
This technology could lead to improved quality control and reliability in semiconductor manufacturing processes.
Original Abstract Submitted
A semiconductor device includes: a memory test circuit that outputs a fourth signal based on a logic level of a second signal corresponding to a first signal output by a host and a logic level of a third signal; a memory device that becomes active or inactive based on a logic level of the fourth signal; and a test logic that outputs the third signal and performs a retention test on the memory device based on the logic level of the second signal.
