18091810. INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING simplified abstract (Intel Corporation)
Contents
- 1 INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Key Features and Innovation
- 1.6 Potential Applications
- 1.7 Problems Solved
- 1.8 Benefits
- 1.9 Commercial Applications
- 1.10 Prior Art
- 1.11 Frequently Updated Research
- 1.12 Questions about Intelligent Sensors for Silicon Life Cycle Management and Testing
- 1.13 Original Abstract Submitted
INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING
Organization Name
Inventor(s)
Rakesh Kandula of Doddakannelli (IN)
Shlomo Avni of Ein Hamifratz (IL)
INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING - A simplified explanation of the abstract
This abstract first appeared for US patent application 18091810 titled 'INTELLIGENT SENSORS FOR HIGH QUALITY SILICON LIFE CYCLE MANAGEMENT AND EFFICIENT INFIELD TESTING
Simplified Explanation
This patent application describes methods and apparatus for intelligent sensors used in silicon life cycle management and testing. The sensors detect events based on signals and configuration data, generating interrupts when necessary.
- The patent application focuses on intelligent sensors for silicon life cycle management and testing.
- The sensors store configuration data in registers and detect events based on sensor signals.
- When an event is detected, the sensors generate interrupts using interrupt generator logic circuitry.
Key Features and Innovation
- Intelligent sensors for high-quality silicon life cycle management.
- Efficient testing of silicon structures and functions in the field.
- Configuration data stored in registers for event detection.
- Generation of interrupts based on detected events.
Potential Applications
- Semiconductor manufacturing processes.
- Quality control in silicon production.
- Field testing of silicon-based devices.
Problems Solved
- Improved management of silicon life cycle.
- Enhanced efficiency in testing silicon structures.
- Better detection of events in silicon devices.
Benefits
- Higher quality silicon products.
- Increased reliability in silicon testing.
- Enhanced performance of silicon-based devices.
Commercial Applications
"Intelligent Sensors for Silicon Life Cycle Management and Testing: Applications and Market Implications" This technology can be used in various industries such as semiconductor manufacturing, electronics, and telecommunications. It can improve the quality and reliability of silicon-based products, leading to increased customer satisfaction and market competitiveness.
Prior Art
Readers interested in prior art related to intelligent sensors for silicon life cycle management and testing can explore research papers, patents, and industry publications in the fields of semiconductor manufacturing, sensor technology, and quality control processes.
Frequently Updated Research
Researchers in the field of sensor technology and semiconductor manufacturing are constantly working on improving the efficiency and accuracy of intelligent sensors for silicon life cycle management. Stay updated on the latest developments in this area to benefit from cutting-edge advancements.
Questions about Intelligent Sensors for Silicon Life Cycle Management and Testing
How do intelligent sensors improve the quality of silicon products?
Intelligent sensors help in detecting events and managing the life cycle of silicon, leading to higher quality products with enhanced reliability and performance.
What are the potential applications of intelligent sensors in silicon life cycle management?
Intelligent sensors can be used in semiconductor manufacturing, quality control processes, and field testing of silicon-based devices to ensure efficient management and testing of silicon structures and functions.
Original Abstract Submitted
Methods and apparatus relating to intelligent sensors for high quality silicon life cycle management as well as efficient infield structural and/or functional testing are described. In an embodiment, one or more registers store configuration data. A sensor having sensor event detection logic circuitry detects an event based at least in part on one or more sensor signals and the stored configuration data. The sensor event detection logic circuitry generates a signal to cause interrupt generator logic circuitry of the sensor to generate an interrupt. Other embodiments are also disclosed and claimed.
