18090199. METHOD AND DEVICE FOR LOCATING CONTACT THROUGH-HOLE (CT) POSITIONS IN MEMORY DEVICE simplified abstract (Yangtze Memory Technologies Co., Ltd.)
Contents
- 1 METHOD AND DEVICE FOR LOCATING CONTACT THROUGH-HOLE (CT) POSITIONS IN MEMORY DEVICE
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 METHOD AND DEVICE FOR LOCATING CONTACT THROUGH-HOLE (CT) POSITIONS IN MEMORY DEVICE - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
METHOD AND DEVICE FOR LOCATING CONTACT THROUGH-HOLE (CT) POSITIONS IN MEMORY DEVICE
Organization Name
Yangtze Memory Technologies Co., Ltd.
Inventor(s)
METHOD AND DEVICE FOR LOCATING CONTACT THROUGH-HOLE (CT) POSITIONS IN MEMORY DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18090199 titled 'METHOD AND DEVICE FOR LOCATING CONTACT THROUGH-HOLE (CT) POSITIONS IN MEMORY DEVICE
Simplified Explanation
The patent application describes a method for locating contact through-hole (CT) positions in a memory device using bright voltage contrast (BVC) imaging technology.
- Obtaining a BVC image with multiple CTs in the memory device.
- Determining the coordinates of the CTs in the BVC image.
- Validating the CT coordinates using a golden CT layout to obtain accurate CT positions.
- Locating the CT positions in the memory device based on the validated coordinates in the BVC image.
Potential Applications
This technology can be applied in the semiconductor industry for quality control and inspection processes in memory device manufacturing.
Problems Solved
This method helps in accurately locating CT positions in memory devices, which is crucial for ensuring proper functionality and performance.
Benefits
- Improved accuracy in locating CT positions - Enhanced quality control in memory device manufacturing - Increased efficiency in inspection processes
Potential Commercial Applications
"Memory Device Inspection and Quality Control Technology"
Possible Prior Art
There may be existing methods for locating CT positions in memory devices using different imaging techniques or algorithms. However, the specific use of BVC imaging and validation against a golden CT layout may be a novel aspect of this technology.
Unanswered Questions
How does this method compare to traditional CT position locating techniques in terms of accuracy and efficiency?
This article does not provide a direct comparison between this method and traditional techniques for locating CT positions in memory devices.
Are there any limitations or constraints in implementing this technology in a manufacturing environment?
The article does not address any potential limitations or constraints that may arise when implementing this technology in a manufacturing setting.
Original Abstract Submitted
A method of locating contact through-hole (CT) positions in a memory device includes: obtaining a bright voltage contrast (BVC) image including a plurality of CTs in the memory device; determining CT coordinates in the BVC image; validating the CT coordinates in the BVC image based on a golden CT layout to obtain validated CT coordinates in the BVC image; and locating the CT positions in the memory device based on the validated CT coordinates in the BVC image.
