18089973. COMMON PATH INTERFEROMETRIC PROBE simplified abstract (INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE)

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COMMON PATH INTERFEROMETRIC PROBE

Organization Name

INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor(s)

Yuan Chin Lee of Hsinchu City (TW)

Chi Shen Chang of Zhubei City (TW)

COMMON PATH INTERFEROMETRIC PROBE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18089973 titled 'COMMON PATH INTERFEROMETRIC PROBE

The abstract describes a common path interferometric probe for identifying a sample, consisting of an optical fiber, a light guide component, a GRIN lens component, and a beamsplitter surface.

  • The optical fiber outputs a light beam.
  • The optical fiber, light guide component, and GRIN lens component are connected sequentially.
  • A reflection surface is on the light guide component, and a beamsplitter surface is in the GRIN lens component.
  • When the light beam travels through the light guide component and reaches the beamsplitter surface, part of it is reflected to form a reference beam, while the rest passes through to form a sample beam.
  • The reference beam travels back to the optical fiber after reflections at the reflection surface and beamsplitter surface.
  • The sample beam reaches the sample after traveling through the GRIN lens component and is reflected back to the optical fiber.

Potential Applications: - Biomedical imaging - Material analysis - Quality control in manufacturing processes

Problems Solved: - Non-invasive sample analysis - High-resolution imaging - Precise measurements

Benefits: - Accurate identification of samples - Real-time monitoring - Versatile applications in various industries

Commercial Applications: - Medical diagnostics - Pharmaceutical research - Semiconductor manufacturing

Questions about the technology: 1. How does the common path interferometric probe improve sample analysis accuracy? 2. What are the advantages of using a GRIN lens component in this setup?


Original Abstract Submitted

A common path interferometric probe for identifying a sample includes an optical fiber, a light guide component, a GRIN lens component and a beamsplitter surface. The optical fiber outputs a light beam. The optical fiber, the light guide component and the GRIN lens component are sequentially connected. The reflection surface is disposed on the light guide component and the beamsplitter surface disposed in the GRIN lens component. When the light beam output from the optical fiber travels through the light guide component and reaches the beamsplitter surface, a part of the light beam is reflected by the beamsplitter surface to form a reference beam, and another part of the light beam passes through the beamsplitter surface to form a sample beam. The reference beam travels back to the optical fiber by undergoing reflections at the reflection surface and beamsplitter surface. The sample beam reaches the sample after traveling through the GRIN lens component, and is reflected by the sample to travel back to the optical fiber.

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