18048952. ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS simplified abstract (NVIDIA Corporation)
Contents
ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
Organization Name
Inventor(s)
Anitha Kalva of San Jose CA (US)
Shantanu Sarangi of Saratoga CA (US)
Sailendra Chadalavada of Saratoga CA (US)
Milind Sonawane of Santa Clara CA (US)
Abilash Nerallapally of Newark CA (US)
ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18048952 titled 'ASYNCHRONOUS IN-SYSTEM TESTING FOR AUTONOMOUS SYSTEMS AND APPLICATIONS
The abstract of this patent application describes systems and methods for testing processing elements of an integrated processing system. A first system test is performed on a first processing element based on accessing a test node associated with it, using a first local test controller. Similarly, a second system test is performed on a second processing element based on accessing a test node associated with it, using a second local test controller.
- Testing processing elements of an integrated processing system
- Performing system tests based on accessing test nodes associated with processing elements
- Using local test controllers to access and perform system tests
- Ensuring the functionality and performance of processing elements in an integrated system
- Improving the reliability and efficiency of integrated processing systems
Potential Applications: - Manufacturing industry for testing integrated processing systems - Electronics industry for quality control of processing elements - Research and development for optimizing system performance
Problems Solved: - Ensuring the proper functioning of processing elements in an integrated system - Identifying and addressing any issues or malfunctions in the system - Streamlining the testing process for integrated processing systems
Benefits: - Enhanced reliability and performance of integrated processing systems - Improved quality control and testing procedures - Increased efficiency in identifying and resolving system issues
Commercial Applications: Title: "Integrated Processing System Testing Technology for Enhanced Reliability" This technology can be utilized in various industries such as manufacturing, electronics, and research and development for testing and optimizing integrated processing systems. It can improve quality control processes and enhance the overall performance of integrated systems, leading to more reliable and efficient operations.
Questions about Integrated Processing System Testing Technology: 1. How does this technology contribute to improving the reliability of integrated processing systems? 2. What are the key advantages of using local test controllers for system testing in integrated processing systems?
Original Abstract Submitted
Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.
