18047652. TEST SYSTEM AND METHOD simplified abstract (NANYA TECHNOLOGY CORPORATION)
Contents
TEST SYSTEM AND METHOD
Organization Name
Inventor(s)
Chien Yu Chen of New Taipei City (TW)
Meng-Kai Hsieh of Nantou County (TW)
TEST SYSTEM AND METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18047652 titled 'TEST SYSTEM AND METHOD
The present disclosure introduces a test system and method for analyzing a system platform, consisting of a data collector and a test monitor.
- The data collector receives and processes signals between a controller and memory of the system platform to generate processed signals.
- The test monitor encodes the processed signals into log information to determine the operation status of the system platform.
Potential Applications: - Quality assurance testing in electronic systems - Performance monitoring in computer networks - Fault detection in industrial control systems
Problems Solved: - Efficient analysis of system platform performance - Real-time monitoring of signal transmission - Identification of system operation issues
Benefits: - Improved system reliability - Enhanced troubleshooting capabilities - Streamlined testing processes
Commercial Applications: Title: "Advanced System Testing Technology for Enhanced Performance Monitoring" This technology can be utilized in industries such as telecommunications, aerospace, and automotive for optimizing system performance and ensuring reliability.
Questions about the technology: 1. How does the test system improve the efficiency of analyzing system platforms? - The test system streamlines the process by collecting and processing signals between components, providing valuable insights into system performance.
2. What are the key benefits of using the test system for monitoring system platforms? - The test system offers improved reliability, enhanced troubleshooting capabilities, and streamlined testing processes for optimal system performance.
Original Abstract Submitted
The present disclosure provides a test system and method. The test system is configured to analyze a system platform and includes a data collector and a test monitor. The data collector is configured to receive a signal transmitted between a controller and a memory of the system platform and is configured to process the signal to generate a processed signal. The test monitor is configured to encode the processed signal into a log information, so as to determine an operation status of the system platform according to the log information.
